Optimal Step Stress Accelerated Life Testing for the Length-Biased Exponential Cumulative Exposure Model

Year 2021, Volume: 13 Issue: 1, 1 - 11, 02.01.2021

Çağatay Çetinkaya

Abstract

This paper considers a simple step stress accelerated life test for units modeled by a length-biased exponential distribution. The cumulative exposure model of time to failure holds in this accelerated life test model. The optimal test plan is constructed by determining the optimal stress change time. Parameters of the model are estimated by using the maximum likelihood estimation method. The corresponding approximate confidence intervals are obtained by using the asymptotic normality features of the maximum likelihood estimators. Theoretical outcomes are illustrated with simulation studies and a real data example.

Keywords

Accelerated life test, Cumulative exposure model, Length-biased exponential distribution, Maximum likelihood estimation, Optimal test plan, Step-stress model

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