Year 2008,
Volume: 8 Issue: 1, 549 - 555, 02.01.2012
Abstract
References
- Knowles, D.I., Should We Move Away From "Acceptable Failure Rate", Communications in Reliability Maintainability and Supportability, Vol. 2, No. 1, P. 23, International RMS Committee, USA, 1995.
- Jerald F. Lawless, Statistical Models and Methods for Lifetime Data, 2nd edition. John Wiley and Sons, Hoboken. 2003.
- Maxim S. Finkelstein, On the Exponential Formula for Reliability, IEEE Transactions on Reliability, Vol.53 No.2, pp. 265-268, June 2004.
- Guangbin Yang, Accelerated Life Tests at Higher Usage Rates, IEEE Transactions on Reliability, Vol.54 No.1, pp. 53-57, March 2005.
- Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.
- Z. Chen, S. Zheng, Lifetime Distribution Based Degradation Analysis, IEEE Transaction On Reliability, Vol.54, No.1,pp. 3-10, March 2005.
- Blanchard, Benjamin S. , Logistics Engineering and Management, Fourth Ed., pp 26-32, Prentice-Hall, Inc., Englewood Cliffs, New Jersey,1992.
- Ebeling, Charles E., , An Introduction to Reliability and Maintainability Engineering, pp 23-32, McGraw-Hill Companies, Inc., Boston, 1997.
- Kapur, K.C., and Lamberson, L.R., , Reliability in Engineering Design, pp 8- 30, John Wiley & Sons, New York,1977.
- MacDiarmid, Preston; Morris, Seymour; et. al., Reliability Toolkit: Commercial Practices Edition, pp 35-39, Reliability Analysis Center and Rome Laboratory, Rome,NewYork.
- G. Duzenli, Development of MOSFET models suitable for simulation of analog CMOS circuits after hot-carrier stress. Ph.D. Thesis, Institute of Science and Technology, Istanbul Technical University; 2003.
- Y. Özcelep, A. Kuntman, H. Kuntman ‘On The Reliability of Symmetrical CMOS OTA Operating in Subthreshold Region’, Proceedings of MELECON'06: The 13th IEEE Mediterranean Electrotechnical Conference, pp.191-194, 16-19 May 2006, Benalmádena, Málaga, Spain.
- Y. Özcelep, “Determination of reliability conditions in MOS transistors with fast
- aging” , Msc Thesis, Institute of Sciences,
- Istanbul University, 2004.
Year 2008,
Volume: 8 Issue: 1, 549 - 555, 02.01.2012
Abstract
STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
References
- Knowles, D.I., Should We Move Away From "Acceptable Failure Rate", Communications in Reliability Maintainability and Supportability, Vol. 2, No. 1, P. 23, International RMS Committee, USA, 1995.
- Jerald F. Lawless, Statistical Models and Methods for Lifetime Data, 2nd edition. John Wiley and Sons, Hoboken. 2003.
- Maxim S. Finkelstein, On the Exponential Formula for Reliability, IEEE Transactions on Reliability, Vol.53 No.2, pp. 265-268, June 2004.
- Guangbin Yang, Accelerated Life Tests at Higher Usage Rates, IEEE Transactions on Reliability, Vol.54 No.1, pp. 53-57, March 2005.
- Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.
- Z. Chen, S. Zheng, Lifetime Distribution Based Degradation Analysis, IEEE Transaction On Reliability, Vol.54, No.1,pp. 3-10, March 2005.
- Blanchard, Benjamin S. , Logistics Engineering and Management, Fourth Ed., pp 26-32, Prentice-Hall, Inc., Englewood Cliffs, New Jersey,1992.
- Ebeling, Charles E., , An Introduction to Reliability and Maintainability Engineering, pp 23-32, McGraw-Hill Companies, Inc., Boston, 1997.
- Kapur, K.C., and Lamberson, L.R., , Reliability in Engineering Design, pp 8- 30, John Wiley & Sons, New York,1977.
- MacDiarmid, Preston; Morris, Seymour; et. al., Reliability Toolkit: Commercial Practices Edition, pp 35-39, Reliability Analysis Center and Rome Laboratory, Rome,NewYork.
- G. Duzenli, Development of MOSFET models suitable for simulation of analog CMOS circuits after hot-carrier stress. Ph.D. Thesis, Institute of Science and Technology, Istanbul Technical University; 2003.
- Y. Özcelep, A. Kuntman, H. Kuntman ‘On The Reliability of Symmetrical CMOS OTA Operating in Subthreshold Region’, Proceedings of MELECON'06: The 13th IEEE Mediterranean Electrotechnical Conference, pp.191-194, 16-19 May 2006, Benalmádena, Málaga, Spain.
- Y. Özcelep, “Determination of reliability conditions in MOS transistors with fast
- aging” , Msc Thesis, Institute of Sciences,
- Istanbul University, 2004.
There are 15 citations in total.
Details
| Primary Language | English |
|---|---|
| Authors | |
| Publication Date | January 2, 2012 |
| IZ | https://izlik.org/JA97XY24LA |
| Published in Issue | Year 2008 Volume: 8 Issue: 1 |