STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Cilt: 8 Sayı: 1 2 Ocak 2012
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STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Öz

STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION

Anahtar Kelimeler

Kaynakça

  1. Knowles, D.I., Should We Move Away From "Acceptable Failure Rate", Communications in Reliability Maintainability and Supportability, Vol. 2, No. 1, P. 23, International RMS Committee, USA, 1995.
  2. Jerald F. Lawless, Statistical Models and Methods for Lifetime Data, 2nd edition. John Wiley and Sons, Hoboken. 2003.
  3. Maxim S. Finkelstein, On the Exponential Formula for Reliability, IEEE Transactions on Reliability, Vol.53 No.2, pp. 265-268, June 2004.
  4. Guangbin Yang, Accelerated Life Tests at Higher Usage Rates, IEEE Transactions on Reliability, Vol.54 No.1, pp. 53-57, March 2005.
  5. Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.
  6. Z. Chen, S. Zheng, Lifetime Distribution Based Degradation Analysis, IEEE Transaction On Reliability, Vol.54, No.1,pp. 3-10, March 2005.
  7. Blanchard, Benjamin S. , Logistics Engineering and Management, Fourth Ed., pp 26-32, Prentice-Hall, Inc., Englewood Cliffs, New Jersey,1992.
  8. Ebeling, Charles E., , An Introduction to Reliability and Maintainability Engineering, pp 23-32, McGraw-Hill Companies, Inc., Boston, 1997.

Ayrıntılar

Birincil Dil

İngilizce

Konular

-

Bölüm

-

Yayımlanma Tarihi

2 Ocak 2012

Gönderilme Tarihi

2 Ocak 2012

Kabul Tarihi

-

Yayımlandığı Sayı

Yıl 2008 Cilt: 8 Sayı: 1

Kaynak Göster

APA
Özcelep, Y., Kuntman, A., & Kuntman, H. (2012). STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering, 8(1), 549-555. https://izlik.org/JA97XY24LA
AMA
1.Özcelep Y, Kuntman A, Kuntman H. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering. 2012;8(1):549-555. https://izlik.org/JA97XY24LA
Chicago
Özcelep, Yasin, Ayten Kuntman, ve Hakan Kuntman. 2012. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering 8 (1): 549-55. https://izlik.org/JA97XY24LA.
EndNote
Özcelep Y, Kuntman A, Kuntman H (01 Ocak 2012) STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering 8 1 549–555.
IEEE
[1]Y. Özcelep, A. Kuntman, ve H. Kuntman, “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”, IU-Journal of Electrical & Electronics Engineering, c. 8, sy 1, ss. 549–555, Oca. 2012, [çevrimiçi]. Erişim adresi: https://izlik.org/JA97XY24LA
ISNAD
Özcelep, Yasin - Kuntman, Ayten - Kuntman, Hakan. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering 8/1 (01 Ocak 2012): 549-555. https://izlik.org/JA97XY24LA.
JAMA
1.Özcelep Y, Kuntman A, Kuntman H. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering. 2012;8:549–555.
MLA
Özcelep, Yasin, vd. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering, c. 8, sy 1, Ocak 2012, ss. 549-55, https://izlik.org/JA97XY24LA.
Vancouver
1.Yasin Özcelep, Ayten Kuntman, Hakan Kuntman. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering [Internet]. 01 Ocak 2012;8(1):549-55. Erişim adresi: https://izlik.org/JA97XY24LA