EN
STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
Öz
STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
Anahtar Kelimeler
Kaynakça
- Knowles, D.I., Should We Move Away From "Acceptable Failure Rate", Communications in Reliability Maintainability and Supportability, Vol. 2, No. 1, P. 23, International RMS Committee, USA, 1995.
- Jerald F. Lawless, Statistical Models and Methods for Lifetime Data, 2nd edition. John Wiley and Sons, Hoboken. 2003.
- Maxim S. Finkelstein, On the Exponential Formula for Reliability, IEEE Transactions on Reliability, Vol.53 No.2, pp. 265-268, June 2004.
- Guangbin Yang, Accelerated Life Tests at Higher Usage Rates, IEEE Transactions on Reliability, Vol.54 No.1, pp. 53-57, March 2005.
- Mark P. Kaminskiy, Vasiliy V. Kristov, A simple Procedure for Bayesian Estimation of the Weibull Distrubition, IEEE Transactions on Reliability, Vol.54 No.4, pp. 612-616, December 2005.
- Z. Chen, S. Zheng, Lifetime Distribution Based Degradation Analysis, IEEE Transaction On Reliability, Vol.54, No.1,pp. 3-10, March 2005.
- Blanchard, Benjamin S. , Logistics Engineering and Management, Fourth Ed., pp 26-32, Prentice-Hall, Inc., Englewood Cliffs, New Jersey,1992.
- Ebeling, Charles E., , An Introduction to Reliability and Maintainability Engineering, pp 23-32, McGraw-Hill Companies, Inc., Boston, 1997.
Ayrıntılar
Birincil Dil
İngilizce
Konular
-
Bölüm
-
Yayımlanma Tarihi
2 Ocak 2012
Gönderilme Tarihi
2 Ocak 2012
Kabul Tarihi
-
Yayımlandığı Sayı
Yıl 2008 Cilt: 8 Sayı: 1
APA
Özcelep, Y., Kuntman, A., & Kuntman, H. (2012). STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering, 8(1), 549-555. https://izlik.org/JA97XY24LA
AMA
1.Özcelep Y, Kuntman A, Kuntman H. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering. 2012;8(1):549-555. https://izlik.org/JA97XY24LA
Chicago
Özcelep, Yasin, Ayten Kuntman, ve Hakan Kuntman. 2012. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering 8 (1): 549-55. https://izlik.org/JA97XY24LA.
EndNote
Özcelep Y, Kuntman A, Kuntman H (01 Ocak 2012) STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering 8 1 549–555.
IEEE
[1]Y. Özcelep, A. Kuntman, ve H. Kuntman, “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”, IU-Journal of Electrical & Electronics Engineering, c. 8, sy 1, ss. 549–555, Oca. 2012, [çevrimiçi]. Erişim adresi: https://izlik.org/JA97XY24LA
ISNAD
Özcelep, Yasin - Kuntman, Ayten - Kuntman, Hakan. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering 8/1 (01 Ocak 2012): 549-555. https://izlik.org/JA97XY24LA.
JAMA
1.Özcelep Y, Kuntman A, Kuntman H. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering. 2012;8:549–555.
MLA
Özcelep, Yasin, vd. “STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION”. IU-Journal of Electrical & Electronics Engineering, c. 8, sy 1, Ocak 2012, ss. 549-55, https://izlik.org/JA97XY24LA.
Vancouver
1.Yasin Özcelep, Ayten Kuntman, Hakan Kuntman. STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION. IU-Journal of Electrical & Electronics Engineering [Internet]. 01 Ocak 2012;8(1):549-55. Erişim adresi: https://izlik.org/JA97XY24LA