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EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS

Year 2002, Volume: 2 Issue: 2, 575 - 591, 09.01.2012

Abstract

   

Year 2002, Volume: 2 Issue: 2, 575 - 591, 09.01.2012

Abstract

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Primary Language English
Journal Section Articles
Authors

Veli Shakhmurov This is me

Publication Date January 9, 2012
Published in Issue Year 2002 Volume: 2 Issue: 2

Cite

APA Shakhmurov, V. (2012). EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS. IU-Journal of Electrical & Electronics Engineering, 2(2), 575-591.
AMA Shakhmurov V. EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS. IU-Journal of Electrical & Electronics Engineering. January 2012;2(2):575-591.
Chicago Shakhmurov, Veli. “EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS”. IU-Journal of Electrical & Electronics Engineering 2, no. 2 (January 2012): 575-91.
EndNote Shakhmurov V (January 1, 2012) EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS. IU-Journal of Electrical & Electronics Engineering 2 2 575–591.
IEEE V. Shakhmurov, “EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS”, IU-Journal of Electrical & Electronics Engineering, vol. 2, no. 2, pp. 575–591, 2012.
ISNAD Shakhmurov, Veli. “EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS”. IU-Journal of Electrical & Electronics Engineering 2/2 (January 2012), 575-591.
JAMA Shakhmurov V. EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS. IU-Journal of Electrical & Electronics Engineering. 2012;2:575–591.
MLA Shakhmurov, Veli. “EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS”. IU-Journal of Electrical & Electronics Engineering, vol. 2, no. 2, 2012, pp. 575-91.
Vancouver Shakhmurov V. EMBEDDING THEOREMS IN BANACH -VALUED SOBOLEV-LIOUVILLE SPACES AND THEIR APPLICATIONS. IU-Journal of Electrical & Electronics Engineering. 2012;2(2):575-91.