| APA |
Temel, B., Kılıc, N., Ozgultekın, B., Ucan, O. N. (2012). SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering, 9(1), 791-796.
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| AMA |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. February 2012;9(1):791-796.
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| Chicago |
Temel, Baybora, Niyazi Kılıc, Bunyamin Ozgultekın, and Osman N. Ucan. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering 9, no. 1 (February 2012): 791-96.
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| EndNote |
Temel B, Kılıc N, Ozgultekın B, Ucan ON (February 1, 2012) SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering 9 1 791–796.
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| IEEE |
B. Temel, N. Kılıc, B. Ozgultekın, and O. N. Ucan, “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”, IU-Journal of Electrical & Electronics Engineering, vol. 9, no. 1, pp. 791–796, 2012.
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| ISNAD |
Temel, Baybora et al. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering 9/1 (February2012), 791-796.
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| JAMA |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. 2012;9:791–796.
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| MLA |
Temel, Baybora et al. “SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS”. IU-Journal of Electrical & Electronics Engineering, vol. 9, no. 1, 2012, pp. 791-6.
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| Vancouver |
Temel B, Kılıc N, Ozgultekın B, Ucan ON. SEPARATION OF ORIGINAL PAINTINGS OF MATISSE AND HIS FAKES USING WAVELET AND ARTIFICIAL NEURAL NETWORKS. IU-Journal of Electrical & Electronics Engineering. 2012;9(1):791-6.
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