Risk-Calibrated Few-Shot Industrial Anomaly Detection with Human-in-the-Loop Inspection
Abstract
Keywords
- Few-shot learning
- human-in-the-loop inspection
- industrial anomaly detection
- risk calibration
- selective decision
Supporting Institution
Project Number
Ethical Statement
Thanks
References
- J. Liu, G. Xie, J. Wang, S. Li, C. Wang, F. Zheng, Y. Jin, Deep industrial image anomaly detection: A survey, Machine Intelligence Research 21 (1) (2024) 104–135.
- K. Roth, L. Pemula, J. Zepeda, B. Schölkopf, T. Brox, P. Gehler, Towards total recall in industrial anomaly detection, IEEE/CVF Conference on Computer Vision and Pattern Recognition, New Orleans, Louisiana, 2022, pp. 14318–14328.
- Z. Fang, X. Wang, H. Li, J. Liu, Q. Hu, J. Xiao, FastRecon: Few-shot industrial anomaly detection via fast feature reconstruction, IEEE/CVF International Conference on Computer Vision, Paris, 2023, pp. 17435–17444.
- J. Jeong, Y. Zou, T. Kim, D. Zhang, A. Ravichandran, O. Dabeer, WinCLIP: Zero-/few-shot anomaly classification and segmentation, IEEE/CVF Conference on Computer Vision and Pattern Recognition, Vancouver, 2023, pp. 19606–19616.
- X. Li, Z. Zhang, X. Tan, C. Chen, Y. Qu, Y. Xie, L. Ma, PromptAD: Learning prompts with only normal samples for few-shot anomaly detection, IEEE/CVF Conference on Computer Vision and Pattern Recognition, Seattle, Washington, 2024, pp. 16848–16858.
- W. Luo, Y. Cao, H. Yao, X. Zhang, J. Lou, Y. Cheng, W. Shen, W. Yu, Exploring intrinsic normal prototypes within a single image for universal anomaly detection, IEEE/CVF Conference on Computer Vision and Pattern Recognition, Nashville, Tennessee, 2025, pp. 9974–9983.
- A. N. Angelopoulos, S. Bates, Conformal prediction: A gentle introduction, Foundations and Trends in Machine Learning 16 (4) (2023) 494–591.
- A. N. Angelopoulos, S. Bates, A. Fisch, L. Lei, T. Schuster, Conformal risk control, The Twelfth International Conference on Learning Representations, Vienna, 2024, pp. 55198–55218.
Details
Primary Language
English
Subjects
Computer Vision, Image Processing, Pattern Recognition
Journal Section
Research Article
Authors
Publication Date
September 30, 2026
Submission Date
May 22, 2026
Acceptance Date
September 12, 2026
Published in Issue
Year 2026 Volume: 12 Number: 3