Research Article

Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films

Volume: 38 Number: 3 September 27, 2026
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Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films

Abstract

In this study, the morphological change of the nanofilms composed of dielectric Ca2NaNb4O13- two-dimensional nanosheets prepared via the single-droplet assembly method was investigated as a function of thermal treatment (room temperature to 450°C). The surface parameters, arithmetic mean roughness (Sa), root mean square height (Sq), Sq/Sa ratio, and slope distribution, were determined from Atomic Force Microscopy images. Based on the Kruskal-Wallis and Dunn’s tests, the heat treatment had a significant effect on the surface morphology of the nanofilms. The Sq/Sa ratio reached at 350°C (1.97 ± 0.33, p < 0.001) indicated that the temporary morphological irregularity. Conversely, the heat treatment at 450°C produced the most uniform surface with the lowest roughness (Sa = 2.75 ± 0.89) and a reduced slope distribution (mean slope of 3.15°, p < 0.001). These findings clearly indicate that the heat treatment at 450°C plays an important role in the successful fabrication of high-quality, dielectric nanofilms for next-generation nano-electronic applications.

Keywords

References

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Details

Primary Language

English

Subjects

Material Characterization

Journal Section

Research Article

Publication Date

September 27, 2026

Submission Date

March 7, 2026

Acceptance Date

August 17, 2026

Published in Issue

Year 2026 Volume: 38 Number: 3

APA
Sağlam, Ö. (2026). Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films. International Journal of Advances in Engineering and Pure Sciences, 38(3), 504-512. https://doi.org/10.7240/jeps.1904563
AMA
1.Sağlam Ö. Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films. JEPS. 2026;38(3):504-512. doi:10.7240/jeps.1904563
Chicago
Sağlam, Özge. 2026. “Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films”. International Journal of Advances in Engineering and Pure Sciences 38 (3): 504-12. https://doi.org/10.7240/jeps.1904563.
EndNote
Sağlam Ö (September 1, 2026) Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films. International Journal of Advances in Engineering and Pure Sciences 38 3 504–512.
IEEE
[1]Ö. Sağlam, “Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films”, JEPS, vol. 38, no. 3, pp. 504–512, Sept. 2026, doi: 10.7240/jeps.1904563.
ISNAD
Sağlam, Özge. “Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films”. International Journal of Advances in Engineering and Pure Sciences 38/3 (September 1, 2026): 504-512. https://doi.org/10.7240/jeps.1904563.
JAMA
1.Sağlam Ö. Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films. JEPS. 2026;38:504–512.
MLA
Sağlam, Özge. “Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films”. International Journal of Advances in Engineering and Pure Sciences, vol. 38, no. 3, Sept. 2026, pp. 504-12, doi:10.7240/jeps.1904563.
Vancouver
1.Özge Sağlam. Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films. JEPS. 2026 Sep. 1;38(3):504-12. doi:10.7240/jeps.1904563