Tek Damla Yöntemi ile Oluşturulmuş Ca₂NaNb₄O₁₃⁻ Nanolevha Filmlerinin Yüzey Pürüzlülüğünün Atomik Kuvvet Mikroskobu ile Nicel Analizi

Öz

Bu çalışmada, tek damla biriktirme yöntemi kullanılarak hazırlanan dielektrik Ca₂NaNb₄O₁₃⁻ iki boyutlu nanolevhalardan oluşan nanofilmlerin morfolojik değişimi, ısıl işlem sıcaklığının bir fonksiyonu olarak (oda sıcaklığından 450 °C’ye kadar) incelenmiştir. Yüzey parametreleri olan aritmetik ortalama pürüzlülük (Sa), kök ortalama kare yükseklik (Sq), Sq/Sa oranı ve eğim dağılımı, Atomik Kuvvet Mikroskobu görüntülerinden belirlenmiştir. Kruskal–Wallis ve Dunn testlerine göre, ısıl işlemin nanofilmlerin yüzey morfolojisi üzerinde istatistiksel olarak anlamlı bir etkisi olduğu anlaşılmıştır. 350 °C’de elde edilen Sq/Sa oranı (1.97 ± 0.33, p < 0.001), yüzeyde geçici bir morfolojik düzensizliğin oluştuğunu göstermiştir. Buna karşılık, 450 °C’de uygulanan ısıl işlem, en düşük pürüzlülük değerleri (Sa = 2.75 ± 0.89) ve azalmış eğim dağılımı (ortalama eğim 3.15°, p < 0.001) ile en düzgün yüzeyi sağlamıştır. Bu bulgular, 450 °C’de uygulanan ısıl işlemin, yeni nesil nanoelektronik uygulamalar için yüksek kaliteli dielektrik nanofilmlerin başarılı şekilde üretilmesinde önemli bir rol oynadığını açıkça göstermektedir.

Anahtar Kelimeler

• Perovskit Nanolevhalar
• İki Boyutlu Malzemeler
• Tek Damla Biriktirme Yöntemi
• Atomik Kuvvet Mikroskobu
• Yüzey Morfolojisi

Quantitative Atomic Force Microscopy Assessment of Surface Roughness in Single-Droplet Assembled Ca2NaNb4O13- Nanosheet Films

Öz

In this study, the morphological change of the nanofilms composed of dielectric Ca2NaNb4O13- two-dimensional nanosheets prepared via the single-droplet assembly method was investigated as a function of thermal treatment (room temperature to 450°C). The surface parameters, arithmetic mean roughness (Sa), root mean square height (Sq), Sq/Sa ratio, and slope distribution, were determined from Atomic Force Microscopy images. Based on the Kruskal-Wallis and Dunn’s tests, the heat treatment had a significant effect on the surface morphology of the nanofilms. The Sq/Sa ratio reached at 350°C (1.97 ± 0.33, p < 0.001) indicated that the temporary morphological irregularity. Conversely, the heat treatment at 450°C produced the most uniform surface with the lowest roughness (Sa = 2.75 ± 0.89) and a reduced slope distribution (mean slope of 3.15°, p < 0.001). These findings clearly indicate that the heat treatment at 450°C plays an important role in the successful fabrication of high-quality, dielectric nanofilms for next-generation nano-electronic applications.

Anahtar Kelimeler

• Perovskite nanosheets
• Two-dimensional nanosheets
• Single-droplet assembly
• Atomic force microscopy
• Surface Morphology

Kaynakça

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