A Study on Sb and F Doped Tin Oxide Thin Films Preparing in Condition of Different Temperature and Molarity and Their Physical Comparison
Abstract
This article is about tin oxide (SnO2:Sb:F) thin films prepared (7 samples at each experiment step) successfully on the glass substrate by using spray pyrolysis method. Different solution molarities and different substrate temperatures were used to prepare precursor solution and fabricate thin films, respectively. And then these thin film’s structural, optical and morphological properties were compared. XRD patterns displayed that the deposited films were polycrystalline with tetragonal structure irrespective of molarity and substrate temperature. Each film has a transmittance of more than 60% in visible region. Optical band gap values were found to be in the range of 3.74-3.95 eV. The SEM and AFM images demonstrated that nanocrystalline particles covered all film surfaces. The best optimum property was found at thin films (0.15 M) prepared with at 520 ˚C and the grains are larger for thin films at 520 C when compared with 480 C. Finally, it is understood that when substrate temperature and molarity increased, more regular structure was obtained.
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References
- Battal A, Tatar D, Kocyigit A, Duzgun B, 2015. Materials Focus, 4: 445-456.
- Carvalho DHQ, Schiavon MA, Raposo MT, de Paiva R, Alves JLA, Paniago RM, Speziali NL, Ferlauto AS, Ardisson JD, 2012. 15th Brazilian Workshop on Semiconductor Physics, 28: 22-27.
- El-Zahed H, El-Korashy A, Rahem MA, 2002. Vacuum, 68: 19-27.
- Huang H, Ng MH, Wu YL, Kong LB, 2015. Materials & Design, 88: 384-389.
- Ikhmayies, S.J. and Ahmad-Bitar, R.N., 2012. Using HF rather than NH4F as doping source for spray-deposited SnO2:F thin films. Journal of Central South University of Technology, 19, 791-796.
- Kadhim IH, Abu Hassan H, 2017. Journal of Electronic Materials, 46: 1419-1426.
- Kou XY, Xie N, Chen F, Wang TS, Guo LL, Wang C, Wang QJ, J Ma, Sun YF, Zhang H, Lu GY, 2018. Sensors and Actuators B-Chemical, 256: 861-869.
- Kumar KDA, Valanarasu S, Jeyadheepan K, Kim H-S, Vikraman D, 2017. Journal of Materials Science: Materials in Electronics, 29: 3648-3656.
Details
Primary Language
English
Subjects
Metrology, Applied and Industrial Physics
Journal Section
Research Article
Publication Date
June 1, 2019
Submission Date
October 2, 2018
Acceptance Date
February 8, 2019
Published in Issue
Year 2019 Volume: 9 Number: 2