An Experimental Examination on the Determination of γ-ray Shielding Parameters of Some Dielectric Materials
Abstract
In this study, γ-ray shielding parameters (transmission factors (TF), linear attenuation coefficients (μ), mass attenuation coefficients (μ⁄ρ), mean free path ("λ" ), radiation protection efficiency (RPE), half-value layer (HVL), and tenth value layer (TVL)) were measured of some dielectric materials (amber, plexiglass, organic glass, quartz, bakelite, NaCl, porcelain, and marble). The absorption measurements were done by EDXRFS (Energy Dispersive X-ray Fluorescence Spectrometer). The study aims to create new areas of use thanks to the measurements and calculations to be made on these technologically important dielectric materials. According to the results obtained, amber is the best gamma ray shielding material, while quartz is not suitable for gamma ray shielding.
Keywords
Dielectric, EDXRFS, RPE, HVL, TVL
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