Microstructural and Optical Properties of ZnO:Eu Films

Year 2018, , 141 - 153, 31.12.2018

Gonca İlgü Büyük , Saliha Ilıcan

https://doi.org/10.31466/kfbd.473808

Cited By: 3

Abstract

Europium (Eu) doped zinc oxide (ZnO) films were grown onto p-type silicon (p-Si) substrates via spin coating technique using the prepared solutions with sol gel method which is simple and economical method. The effects of Eu on the structural, morphological and optical properties of the obtained ZnO film was investigated by using X-ray diffractometer, scanning electron microscopy and uv-vis spectrophotometer, respectively. From the XRD spectra of the films, it was determined that all the films belong to the hexagonal wurtzite structure of zincite (ZnO) phase and had (002) preferential orientation. SEM photographs of ZnO:Eu films were analyzed by ImageJ program. It was observed that all films had a homogeneous and uniform surface and consisted of nanoparticles. No significant change was observed in the surface morphology of the ZnO film, by Eu doping. The diffuse reflectance spectra of ZnO: Eu films were measured using an integrated sphere attachment UV-vis spectrophotometer. Using these spectra, the optical band gap values of the films were determined using both the differential reflectance spectra and the Kubelka-Munk function.

Keywords

Europium, Zinc oxide, Nanoparticle, Sol gel, Kubelka-Munk

ZnO:Eu Filmlerinin Mikroyapısal ve Optik Özellikleri

Abstract

Evropiyum (Eu) katkılı çinko oksit (ZnO) filmleri, ucuz ve basit bir metot olan sol jel metodu ile elde edilen çözeltiler kullanılarak p-tipi silisyum (p-Si) alttaşlar üzerine spin kaplama tekniği ile büyütülmüştür. Elde edilen ZnO filminin yapısal, morfolojik ve optik özellikleri üzerine Eu katkısının etkisi, sırasıyla X-ışını kırınım cihazı, taramalı elektron mikroskobu ve uv-vis spektrofotometresi kullanılarak araştırılmıştır. Filmlerin XRD spektrumlarından, bütün filmlerin hekzagonal wurtzite zinkit (ZnO) yapıya ait olduğu ve (002) tercihli yönelime sahip olduğu belirlenmiştir. ZnO:Eu filmlerinin çekilen SEM fotoğrafları ImageJ programı ile analiz edilmiştir. Bütün filmlerin yüzeylerinin homojen ve düzgün yapıya sahip olduğu ve nanoparçacıklardan oluştuğu; yapılan Eu katkısının ZnO yüzey morfolojisinde önemli bir değişiklik olmadığı gözlenmiştir. ZnO:Eu filmlerinin diffüz yansıma spektrumları, entegre küre aparatlı UV-vis spektrofotometre yardımıyla ölçülmüştür. Bu spektrumlar kullanılarak filmlerin optik bant aralık değerleri, hem diferansiyel yansıma spektrumları hem de Kubelka-Munk fonksiyonu kullanılarak belirlenmiştir.

Keywords

Evropiyum, Çinko oksit, Nanoparçacık, Sol jel, Kubelka-Munk

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