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Optical Properties of AlInN/AlN HEMTs in Detail

Year 2022, , 521 - 529, 15.12.2022
https://doi.org/10.31466/kfbd.954421

Abstract

In this study, the optical properties of AlInN/AlN high electron mobility transistor (HEMT) structure, grown on c-oriented sapphire with Metal-Organic Chemical Vapor Deposition (MOCVD) technique, being investigated. Optical characterization is made Kubelka- Munk method. Transmittance, absorbance, and reflectance are investigated in detail. Also, the Kubelka-Munk theory is employed to determine the forbidden energy band gap of InN by using special functions. The energy band gap obtained by this method was compared.

Supporting Institution

Presidency Strategy and Budget Directorate

Project Number

2016K121220

References

  • Vurgaftman, I., and Meyer, J. R. (2003). Band parameters for nitrogen-containing semiconductors. Journal of Applied Physics, 94(6), 3675-3696.
  • Aleksan, R., Bolognese, T., Equer, B., Karar, A., and, Reymond, J. M. (1990). Observation of Single Minimum Ionizing Particles with Amorphous-Silicon Diodes. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 305(3), 512-516.
  • Li, Y., Qian, F., Gredecak, S., Wu, Y., Yan, H., Blom, D. A., and, Lieber, C. M. (2006). Dopant-free GaN/AlN/AlGaN radial nanowire heterostructures as high electron mobility transistors. Nano Letters, 6(7), 1468-1473.
  • Nakamura, S. (1991). Gan Growth Using Gan Buffer Layer. Japanese Journal of Applied Physics Part 2-Letters, 30(10a), 1705-1707.
  • Xing, H., Keller, S., Wu, Y. F., Mccarty, L., Smorchkova, I. P., Buttari, D., Coffie, R., Green, D. S., Parish, G., Heikman, S., Shen, L., Zhang, N., Xu, J. J., Denbaars, S. P., and, Mishra, U. K. (2001). Gallium nitride-based transistors. Journal of Physics-Condensed Matter, 13(32), 7139-7157.
  • Hajlaoui, M., Sediri, H., Pierucci, D., Henck, H., Phuphachong, T., Silly M., Vaulchier, L., Sirotti, F., Guldner, Y., Belkhou, R., and Ouerghi, A. (2016). High Electron Mobility in Epitaxial Trilayer Graphene on Off-axis SiC(0001). Scientific Reports, 22(7), 1-7
  • Akpinar, O., Bilgili, A. K., Baskose, U. C., Ozturk, M. K., Ozcelik, S., and, Ozbay, E. (2020). Swanepoel method for AlInN/AlN HEMTs. Journal of Materials Science: Materials in Electronics, 31, (9969-9973).
  • Groh, C. L., Brien, W. J., and, Boenke, K. M. (1992). Differences in color between fired porcelain and shade guides. Int J Prosthodont, 5(6), 510-4.
  • Osa, R. A., Iparragirre, I., Ortiz, D., and Saiz, J. M. (2020). The extended Kubelka-Munk theory and its application to spectroscopy. ChemTexts, 6(2), 1585.
  • Murphy, A. B. (2007). Band-gap determination from diffuse reflectance measurements of semiconductor films, and application to photoelectrochemical water-splitting. Solar Energy Materials& Solar Cells. 91, 1326–1337.
  • Inbaraj, P. F. H., Prince, J. J. (2018). Optical and structural properties of Mg-doped ZnO thin films by a chemical bath deposition method. Journal of Materials Science: Materials in Electronics, 29(2), 935–943.

AlInN/AlN HEMT’in Detaylı Optik Özellikleri

Year 2022, , 521 - 529, 15.12.2022
https://doi.org/10.31466/kfbd.954421

Abstract

Bu çalışmada, Metal Organik Kimyasal Buhar Biriktirme (MOCVD) tekniği ile c-yönelimli safir üzerinde büyütülen AlInN/AlN yüksek elektron hareketli transistör (HEMT) yapısının optik özellikleri incelenmiştir. Optik karakterizasyon Kubelka-Munk yöntemiyle yapılmıştır. Geçirgenlik, absorbans, yansıma detaylı olarak incelenmiştir. Ayrıca özel fonksiyonlar kullanarak InN'nin yasak enerji bant aralığını belirlemek için Kubelka-Munk teorisinden yararlanılmıştır. Bu yöntemle elde edilen enerji bant aralığının karşılaştırılması yapılmıştır.

Project Number

2016K121220

References

  • Vurgaftman, I., and Meyer, J. R. (2003). Band parameters for nitrogen-containing semiconductors. Journal of Applied Physics, 94(6), 3675-3696.
  • Aleksan, R., Bolognese, T., Equer, B., Karar, A., and, Reymond, J. M. (1990). Observation of Single Minimum Ionizing Particles with Amorphous-Silicon Diodes. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 305(3), 512-516.
  • Li, Y., Qian, F., Gredecak, S., Wu, Y., Yan, H., Blom, D. A., and, Lieber, C. M. (2006). Dopant-free GaN/AlN/AlGaN radial nanowire heterostructures as high electron mobility transistors. Nano Letters, 6(7), 1468-1473.
  • Nakamura, S. (1991). Gan Growth Using Gan Buffer Layer. Japanese Journal of Applied Physics Part 2-Letters, 30(10a), 1705-1707.
  • Xing, H., Keller, S., Wu, Y. F., Mccarty, L., Smorchkova, I. P., Buttari, D., Coffie, R., Green, D. S., Parish, G., Heikman, S., Shen, L., Zhang, N., Xu, J. J., Denbaars, S. P., and, Mishra, U. K. (2001). Gallium nitride-based transistors. Journal of Physics-Condensed Matter, 13(32), 7139-7157.
  • Hajlaoui, M., Sediri, H., Pierucci, D., Henck, H., Phuphachong, T., Silly M., Vaulchier, L., Sirotti, F., Guldner, Y., Belkhou, R., and Ouerghi, A. (2016). High Electron Mobility in Epitaxial Trilayer Graphene on Off-axis SiC(0001). Scientific Reports, 22(7), 1-7
  • Akpinar, O., Bilgili, A. K., Baskose, U. C., Ozturk, M. K., Ozcelik, S., and, Ozbay, E. (2020). Swanepoel method for AlInN/AlN HEMTs. Journal of Materials Science: Materials in Electronics, 31, (9969-9973).
  • Groh, C. L., Brien, W. J., and, Boenke, K. M. (1992). Differences in color between fired porcelain and shade guides. Int J Prosthodont, 5(6), 510-4.
  • Osa, R. A., Iparragirre, I., Ortiz, D., and Saiz, J. M. (2020). The extended Kubelka-Munk theory and its application to spectroscopy. ChemTexts, 6(2), 1585.
  • Murphy, A. B. (2007). Band-gap determination from diffuse reflectance measurements of semiconductor films, and application to photoelectrochemical water-splitting. Solar Energy Materials& Solar Cells. 91, 1326–1337.
  • Inbaraj, P. F. H., Prince, J. J. (2018). Optical and structural properties of Mg-doped ZnO thin films by a chemical bath deposition method. Journal of Materials Science: Materials in Electronics, 29(2), 935–943.
There are 11 citations in total.

Details

Primary Language English
Subjects Engineering
Journal Section Articles
Authors

Ömer Akpınar 0000-0002-5172-8283

Ahmet Bilgili This is me 0000-0003-3420-4936

Mustafa Öztürk 0000-0002-8508-5714

Süleyman Özçelik 0000-0002-3761-3711

Project Number 2016K121220
Publication Date December 15, 2022
Published in Issue Year 2022

Cite

APA Akpınar, Ö., Bilgili, A., Öztürk, M., Özçelik, S. (2022). Optical Properties of AlInN/AlN HEMTs in Detail. Karadeniz Fen Bilimleri Dergisi, 12(2), 521-529. https://doi.org/10.31466/kfbd.954421