BibTex RIS Kaynak Göster

Alttaş sıcaklığının expanding thermal plazma yöntemi ile elde edilen a-Si:H filmlerin optik ve elektriksel özellikleri üzerine etkisi

Yıl 2011, Cilt: 2 Sayı: 1, 40 - 49, 01.06.2011

Öz

Optical properties and dark current activation energy of hydrogenated amorphous silicon (a,Si:H) produced by the expanding thermal plasma chemical vapour deposition (ETPCVD) technique are investigated as a function of substrate temperature in the 150,500°C temperature range. The optical transmission spectra were used to obtain the thickness, refractive index, and optical band gap of the a, Si:H films. It is observed that while the refractive index is increasing with substrate temperature, the optical band gap and deposition rate, as well as the dark conductivity activation energy, are decreasing.

Kaynakça

  • Brinza, M. et al., (2002). J. Non-Cryst. Solids, 299, 420.
  • Willekens, J. et al., (2004) Optical Spectrocopy of the Gap State Density in Etp-Deposited a-Si:H, Journal of Non-Crystalline Solids,338-340, 244-248.
  • Güngör, T. (1998). Determination of optical constant and thickness for a-SiNx:H thin film, Journal of Research in Physics, 27, No.1, 1-9.
  • Güngör, T. (2002). Turkish Journal of Physics, 26, 269 (2002).
  • Güngör, T. & Saka, B. (2004). Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum using a genetic algorithm, Thin Solid Films, 467, 319-325.
  • Golikova, O. A. et al., (1997). Physics and Astronomy Semiconductors,Volume 31, Number 7, 691-694.
  • Iakoubovskii, K. (2000) Optical Study of Defects in Diamond, PhD. Thesis, University of Leuven.
  • Kessels, W. M. M. (2000). Remote Plasma Deposition of Hydrogenated Amorphous Silicon: Plasma Processes, Film Growth, and the Material Properties, PhD. Thesis, Eindhoven University of Technology.
  • Kessels, W. M. M. et al., (2000). J. Vac. Sci. Technol. A., 18, 2153.
  • Korevaar, B. A. et al., (2002). Proc. 29th IEEE Photovoltaic Conference.
  • Smets, A. H. M., et al., (2000). J. Appl.Phys. 88, 6388.
  • Swanepoel R. (1983). Determination of the thickness and optical constants of amorphous silicon, J. Phys., E. Sci. Instrum., 16, 1214-1222.
  • Tauc, J., Grigorovici, R., & Vancu, A., (1966). Optical properties and electronic structure of amorphous germanium, Phys.Stat. Sol. 15, 627.

Effects of substrate temperature on optical and electrical properties of a-Si:H films produced by expanding thermal plasma thecnique

Yıl 2011, Cilt: 2 Sayı: 1, 40 - 49, 01.06.2011

Öz

Optical properties and dark current activation energy of hydrogenated amorphous silicon (a,Si:H) produced by the expanding thermal plasma chemical vapour deposition (ETPCVD) technique are investigated as a function of substrate temperature in the 150,500°C temperature range. The optical transmission spectra were used to obtain the thickness, refractive index, and optical band gap of the a, Si:H films. It is observed that while the refractive index is increasing with substrate temperature, the optical band gap and deposition rate, as well as the dark conductivity activation energy, are decreasing.

Kaynakça

  • Brinza, M. et al., (2002). J. Non-Cryst. Solids, 299, 420.
  • Willekens, J. et al., (2004) Optical Spectrocopy of the Gap State Density in Etp-Deposited a-Si:H, Journal of Non-Crystalline Solids,338-340, 244-248.
  • Güngör, T. (1998). Determination of optical constant and thickness for a-SiNx:H thin film, Journal of Research in Physics, 27, No.1, 1-9.
  • Güngör, T. (2002). Turkish Journal of Physics, 26, 269 (2002).
  • Güngör, T. & Saka, B. (2004). Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum using a genetic algorithm, Thin Solid Films, 467, 319-325.
  • Golikova, O. A. et al., (1997). Physics and Astronomy Semiconductors,Volume 31, Number 7, 691-694.
  • Iakoubovskii, K. (2000) Optical Study of Defects in Diamond, PhD. Thesis, University of Leuven.
  • Kessels, W. M. M. (2000). Remote Plasma Deposition of Hydrogenated Amorphous Silicon: Plasma Processes, Film Growth, and the Material Properties, PhD. Thesis, Eindhoven University of Technology.
  • Kessels, W. M. M. et al., (2000). J. Vac. Sci. Technol. A., 18, 2153.
  • Korevaar, B. A. et al., (2002). Proc. 29th IEEE Photovoltaic Conference.
  • Smets, A. H. M., et al., (2000). J. Appl.Phys. 88, 6388.
  • Swanepoel R. (1983). Determination of the thickness and optical constants of amorphous silicon, J. Phys., E. Sci. Instrum., 16, 1214-1222.
  • Tauc, J., Grigorovici, R., & Vancu, A., (1966). Optical properties and electronic structure of amorphous germanium, Phys.Stat. Sol. 15, 627.
Toplam 13 adet kaynakça vardır.

Ayrıntılar

Birincil Dil Türkçe
Bölüm Araştırma Makalesi
Yazarlar

Tayyar Güngör Bu kişi benim

Guy J. Adrıaenssens Bu kişi benim

Yayımlanma Tarihi 1 Haziran 2011
Yayımlandığı Sayı Yıl 2011 Cilt: 2 Sayı: 1

Kaynak Göster

APA Güngör, T., & Adrıaenssens, G. J. (2011). Alttaş sıcaklığının expanding thermal plazma yöntemi ile elde edilen a-Si:H filmlerin optik ve elektriksel özellikleri üzerine etkisi. Mehmet Akif Ersoy Üniversitesi Fen Bilimleri Enstitüsü Dergisi, 2(1), 40-49.