Sol Jel Yöntemiyle Elde Edilen ZnO Filminin Yapısal, Morfolojik ve Optik Özelliklerine Erbiyum Katkısının Etkisi

Year 2019, , 179 - 192, 30.11.2019

Gonca İlgü Büyük , Saliha Ilıcan

https://doi.org/10.29233/sdufeffd.528740

Abstract

Katkısız ve Erbiyum (Er) katkılı çinko oksit (ZnO)
filmleri sol jel spin kaplama yöntemi ile p-Si alttaşlar üzerine elde
edilmiştir. ZnO filminin yapısal, morfolojik ve optik özellikleri üzerine Er
katkısının etkisi sırasıyla, X-ışını kırınım cihazı, taramalı elektron
mikroskobu (SEM) ve UV-vis spektrofotometresi kullanılarak araştırılmıştır.
X-ışınları kırınımı (XRD) spektrumlarından, bütün filmlerin hekzagonal wurtzite
yapıda ve zinkit fazda kristallendiği belirlenmiştir. Kristallenme boyutu,
dislokasyon yoğunluğu, örgü parametreleri, kristal yapıdaki deformasyon ve
gerilim gibi yapısal parametreler hesaplanmıştır. SEM görüntülerinden, film
yüzeylerinin çatlaklar ve gözenekler olmadan iyi kaplanmış ve homojen olduğu
görülmektedir. Ortalama tane boyutu, tane sınırları ve filmlerin yüzey
durumlarının araştırılması için ImageJ programı kullanılmıştır. UV
sprektrofotometresi ile optik ölçümler yapılmış ve optik bant aralığı
diferansiyel yansıma ve Kubelka-Munk teorisiyle belirlenmiştir. Her iki
yöntemden de, ZnO filminin optik band değerinin Er katkısıyla düzensiz olarak
artıp azaldığı belirlenmiştir. %0,4 Er katkılı ZnO filminin optik band
aralığının diğer filmlere göre daha büyük olduğu gözlenmiştir.

Keywords

ZnO, Sol-Jel, SEM, XRD, Kubelka-Munk

Supporting Institution

Anadolu Üniversitesi Bilimsel Araştırma Komisyonu

Project Number

1501F032 no’lu lisansüstü projesi

Effect of Erbium on Structural, Morphological and Optical Properties of Sol Gel Derived ZnO Film

Abstract

Undoped and Erbium (Er) doped zinc oxide (ZnO)
films were prepared on p-Si substrates by sol gel method using spin coating
technique. The effect of Er dopant on the structural, morphological and optical
properties of ZnO film was investigated by X-ray diffractometer, scanning
electron microscope (SEM) and UV-vis spectrophotometer, respectively. From
X-ray diffraction (XRD) spectra, the films were crystallized in hexagonal
wurtzite structure in zincite phase. The structural parameters such as grain
size, dislocation density, lattice parameters, strain and stress were
calculated. From the SEM images, it is seen that the film surfaces are
well-coated, uniform, without cracks and pores. ImageJ program was used to
investigate the average particle size, grain boundaries and the surface of the
films. The optical properties were studied by diffuse reflectance spectra
measured by UV-vis spectrophotometer and the optical band gap values were
determined by differential reflectance and Kubelka-Munk theory. In both
methods, it was determined the optical band gap value of ZnO film increases or
decreases irregularly with the Er content. It was observed that the optical
band gap of the 0.4% Er doped ZnO film was larger than the other films.

Keywords

ZnO, Sol gel, SEM, XRD, Kubelka-Munk

Project Number

1501F032 no’lu lisansüstü projesi

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