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Variable-Angle Spectroellipsometric Characterization of CdS Thin Films

Year 2014, Volume: 9 Issue: 2, 137 - 146, 31.12.2014

Abstract

In this work, CdS thin films produced by ultrasonic spray pyrolysis technique. The optical properties of CdS thin films were investigated using spectroscopic ellipsometry and UV-VIS Spectrophotometer. The optical properties of CdS thin films coated glass substrates were evaluated by variable-angle spectroscopic ellipsometry. Variable angle spectroscopic ellipsometry was used for thickness and optical constant calculations. Multiple angle measurements were taken in the most sensitive angle of incidence region. Appropriate incident angle were obtained as experimental using graph of ψ and Δ. Cauchy-Urbach model was used to determine the thickness, refractive index and extinction coefficient for CdS thin films. Also, transmittance measurements and band gap values of the films was examined by UV-VIS spectrophotometer and optical method, respectively. Finally, the incidence angle effects were discussed on the optical properties of CdS thin films such as thickness and optical constant (refractive index and extinction coefficient)

References

  • Chu T.L., Chu S.S., 1993. Efficient thin film CdS/CdTe solar cells, Progress Photovoltaics, 1: 31-42.
  • Davis A., Vaccoro K., Dauplaise, Waters W., Lorenzo J., 1999. Optimization of chemical bath- deposited cadmium sulfide on InP using a novel sulfur pretreatment, Journal of Electrochemical Society, 146: 1046-1053.
  • Vigil O., Riech I., Garcia-Rocha M., Zelaya-Angle O., 1997. Characterization of defect levels in chemically deposited CdS films in The cubic-to hexagonal phase transition, Journal of Vacuum Science Technology A, 15: 2282-2286.
  • Yu I., Isobe T., Senna M., 1995. Preparation and properties CdS thin films comprising nano-particles by a solution growth technique, Material Research Bulletin, 30: 975-985.
  • Mahdi M.A., Hassan J.J., Kasim S.J., Ng S.S., Hassan Z., 2014. Optical properties of CdS micro/nanocrystalline structures prepared via a thermal evaporation method, Materials Science in Semiconductor Processing, 26: 87–92.
  • Smith G. B., Ignatiev A., Zajac G., 1980. Solar Selective Black Cobalt: Preparation, Structure and Thermal Stability, Journal of Applied Physics, 51:4186-4196.
  • Lepek M., Dogil B., Ciecholewski R., 1983. A Study of CdS thin film deposition, Thin Solid Films, 109: 103-107.
  • Ahmed-Bitar R.N., 2000. Effect of doping and heat treatment on the photoluminescence of CdS films deposited by spray pyrolysis, Renewable Energy, 19: 579-586.
  • Ashour A., 2003. Physical properties of spray pyrolysed CdS thin films, Turkish Journal of Physics, 27: 551-558.
  • Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  • Podesta A., Armani N., Saltavi G., Romeo N., Bosio A., Prato M., 2006. Influence of fluorine doping on the optical properties of CdS thin films for photovoltaic applications, Thin Solid Films, 511- 512: 448-452.
  • Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  • Senthil K., Mangalaraj D., Narayandass Sa.K., Adachi S., 2000. Optical constants of vacuum- evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry, Material Science Engineering B, 78: 53-58.
  • Sridharan M., Narayandass Sa.K., Manglanaj D., Lee H.C., 2002. Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry, Crystal Research Technology, 37:964-975.
  • E Birgin. G., I Chambouleyron. and Martınez J. M., 1999. Es-timation of the optical constants and the thickness of thin films using unconstrained optimization, Journal of Computational Physics, 151(2): 862- 880.
  • Swanepoel R., 1983. Determination of the thickness and optical constants of amorphous silicon, Journal of Physics E: Scientific Instruments, 16: 1214-1222.
  • Gencyılmaz O., Karakaya S., F Atay., Ozbas O., and Akyuz I., 2012. Structural and optical properties of transparent polycrystalline ZnO films, AIP Conf. Proc., 1476: 216-220.
  • Liu A., Xue J., Meng X., Sun J., Huang Z., Chu J., 2008. Infrared optical properties of Ba(Zr0.20Ti0.80)O3 and Ba(Zr0.30Ti0.70)O3 thin films prepared by sol–gel method, Applied Surface Science, 254: 5660-5663.
  • Xu J., Gao C., Zhai J., Yao X., Xue J., Huang Z., 2006. Structure-related infrared optical properties of Ba(ZrxTi1-x)O3 thin films grown on Pt/Ti/SiO2/Si substrates by low-temperature processing, Journal of Crystal Growth, 291: 130-134.
  • Huang Z., Chu J., 2001. The refractive index dispersion of Hg1-xCdxTe by infrared spectroscopic ellipsometry, Infrared Physics Technology, 42:77-84.
  • Shan F.K., Z. Liu F., Liu G.X., Shin B.C., Yu Y.S., Kim S.Y., Kim T.S., 2004. spectroscopic ellipsometry characterization of Al-doped ZnO thin films deposited by pulsed laser deposition, Journal of the Korean Physical Society, 44 (5): 1215-1219.
  • Azzam R.M.A., Bashara N.M., Ellipsometry and Polarized Light, North-Holland, New York, 1977.
  • Khoshman J.M., Kordesch M.E., 2005. Spectroscopic ellipsometry characterization of amorphous aluminum nitride and indium nitride thin films, Physica Statatus Solidi, C2(7): 2821-2827.
  • Goyal D.K., Pribil G.K., Woollam J.A., Subramanian A., 2008. Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry, Material Science Engineer B., 149: 26-33.
  • Mansour M., Naciri A.E., Johann L., Duguay S., Grob J.J., Stchakovsky M., Eypert C., 2006. Dielectric function of germanium nanocrystals between 0.6 and 6.5 eV by spectroscopic ellipsometry, Journal of Physics and Chemistry Solids, 67:1291-1300.
  • Jellison G.E., 2004. Generalized ellipsometry for materials characterization, Thin Solid Films 450: 42-47.
  • Khoshman J.M., Kordesch M.E., 2005. Bandgap engineering in amorphous BexZnyO thin films Journal of Non-Crystal Solids, 351:3334-3340.
  • Castilloa S.J., Mendoza-Galv nc A., amı rez-Bonc ., Espinoza-Beltr nc .J., Sotelo-Lermab M., Gonz lez-Hern ndezc J., Martı nez G., 000. Structural, optical and electrical characterization of In/CdS/glass thermally annealed system, Thin Solid Films, 373: 10-14.
  • Podesta A., Armani N., Salviati G., Romeo N., Bosio A., Prato M., 2006. Influence of the fluorine doping on the optical properties of CdS thin films for photovoltaic applications, Thin Solid Films, 511: 448-452.
  • Parmenter R.H., 1955. Energy levels of a disordered alloy, Physics Review Letters, 97: 587-698.
  • Melsheimer J., Ziegler O., 1985. Band gap energy and Urbach tail studies of amorphous, partially crystalline and polycrystalline tin dioxide, Thin Solid Films, 129: 35-37.
  • Tan S.T., Chen B.J., Sun X.W., Fan W.J., Kwok H.S., Zhang X.H., Chua S.J., 2005. Blueshift of optical band gap in ZnO thin films grown by metal-organic chemical-vapor deposition, Journal of Applied Physics, 98:013505(1-5).
  • Ferhunde Atay e-mail: fatay@ogu.edu.tr
  • İdris Akyüz e-mail: iakyuz@ogu.edu.tr

CdS İnce Filmlerinin Değişik Açılarda Spektroelipsometrik Karakterizasyonu

Year 2014, Volume: 9 Issue: 2, 137 - 146, 31.12.2014

Abstract

Bu çalışmada, CdS ince filmleri ultrasonik kimyasal püskürtme tekniği kullanılarak üretildi. CdS ince filmlerinin optik özellikleri spektroskopik elipsometre ve UV-VIS spektrofotometre kullanılarak belirlendi. Cam tabanlar üzerine depolanan CdS ince filmlerinin optik özellikleri değişken açılardaki spektroskopik ellipsometre ölçüleri kullanılarak incelendi. Kalınlıkların ve optik sabitlerin hesaplamaları değişken açılardaki elipsometrik ölçümler kullanılarak yapıldı. En duyarlı gelme açısını belirlemek için çeşitli açılarda ölçümler yapıldı. Uygun gelme açısı, ï¹ ve ï„ grafikleri kullanılarak deneysel olarak elde edildi. CdS ince filmlerinin kalınlıklarını, kırılma indisi ve sönüm katsayısı değerlerini belirlemek için Cauchy-Urbach modeli kullanıldı. Ayrıca, geçirgenlik ölçümleri ve bant aralığı değerleri sırasıyla UV-VIS spektrofotometre ve optik metot kullanılarak belirlendi. Sonuç olarak, CdS ince filmlerinin kalınlık ve optik sabitler (kırılma indisi ve sönüm katsayısı) gibi optik özelikleri üzerine gelme açısının etkileri tartışılmıştır.

References

  • Chu T.L., Chu S.S., 1993. Efficient thin film CdS/CdTe solar cells, Progress Photovoltaics, 1: 31-42.
  • Davis A., Vaccoro K., Dauplaise, Waters W., Lorenzo J., 1999. Optimization of chemical bath- deposited cadmium sulfide on InP using a novel sulfur pretreatment, Journal of Electrochemical Society, 146: 1046-1053.
  • Vigil O., Riech I., Garcia-Rocha M., Zelaya-Angle O., 1997. Characterization of defect levels in chemically deposited CdS films in The cubic-to hexagonal phase transition, Journal of Vacuum Science Technology A, 15: 2282-2286.
  • Yu I., Isobe T., Senna M., 1995. Preparation and properties CdS thin films comprising nano-particles by a solution growth technique, Material Research Bulletin, 30: 975-985.
  • Mahdi M.A., Hassan J.J., Kasim S.J., Ng S.S., Hassan Z., 2014. Optical properties of CdS micro/nanocrystalline structures prepared via a thermal evaporation method, Materials Science in Semiconductor Processing, 26: 87–92.
  • Smith G. B., Ignatiev A., Zajac G., 1980. Solar Selective Black Cobalt: Preparation, Structure and Thermal Stability, Journal of Applied Physics, 51:4186-4196.
  • Lepek M., Dogil B., Ciecholewski R., 1983. A Study of CdS thin film deposition, Thin Solid Films, 109: 103-107.
  • Ahmed-Bitar R.N., 2000. Effect of doping and heat treatment on the photoluminescence of CdS films deposited by spray pyrolysis, Renewable Energy, 19: 579-586.
  • Ashour A., 2003. Physical properties of spray pyrolysed CdS thin films, Turkish Journal of Physics, 27: 551-558.
  • Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  • Podesta A., Armani N., Saltavi G., Romeo N., Bosio A., Prato M., 2006. Influence of fluorine doping on the optical properties of CdS thin films for photovoltaic applications, Thin Solid Films, 511- 512: 448-452.
  • Mathew S., Mukerjee P.S., Vijayakumar K.P., 1995. Optical and surface properties of spray- pyrolysed CdS thin films, Thin Solid Films, 254: 278-284.
  • Senthil K., Mangalaraj D., Narayandass Sa.K., Adachi S., 2000. Optical constants of vacuum- evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry, Material Science Engineering B, 78: 53-58.
  • Sridharan M., Narayandass Sa.K., Manglanaj D., Lee H.C., 2002. Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry, Crystal Research Technology, 37:964-975.
  • E Birgin. G., I Chambouleyron. and Martınez J. M., 1999. Es-timation of the optical constants and the thickness of thin films using unconstrained optimization, Journal of Computational Physics, 151(2): 862- 880.
  • Swanepoel R., 1983. Determination of the thickness and optical constants of amorphous silicon, Journal of Physics E: Scientific Instruments, 16: 1214-1222.
  • Gencyılmaz O., Karakaya S., F Atay., Ozbas O., and Akyuz I., 2012. Structural and optical properties of transparent polycrystalline ZnO films, AIP Conf. Proc., 1476: 216-220.
  • Liu A., Xue J., Meng X., Sun J., Huang Z., Chu J., 2008. Infrared optical properties of Ba(Zr0.20Ti0.80)O3 and Ba(Zr0.30Ti0.70)O3 thin films prepared by sol–gel method, Applied Surface Science, 254: 5660-5663.
  • Xu J., Gao C., Zhai J., Yao X., Xue J., Huang Z., 2006. Structure-related infrared optical properties of Ba(ZrxTi1-x)O3 thin films grown on Pt/Ti/SiO2/Si substrates by low-temperature processing, Journal of Crystal Growth, 291: 130-134.
  • Huang Z., Chu J., 2001. The refractive index dispersion of Hg1-xCdxTe by infrared spectroscopic ellipsometry, Infrared Physics Technology, 42:77-84.
  • Shan F.K., Z. Liu F., Liu G.X., Shin B.C., Yu Y.S., Kim S.Y., Kim T.S., 2004. spectroscopic ellipsometry characterization of Al-doped ZnO thin films deposited by pulsed laser deposition, Journal of the Korean Physical Society, 44 (5): 1215-1219.
  • Azzam R.M.A., Bashara N.M., Ellipsometry and Polarized Light, North-Holland, New York, 1977.
  • Khoshman J.M., Kordesch M.E., 2005. Spectroscopic ellipsometry characterization of amorphous aluminum nitride and indium nitride thin films, Physica Statatus Solidi, C2(7): 2821-2827.
  • Goyal D.K., Pribil G.K., Woollam J.A., Subramanian A., 2008. Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry, Material Science Engineer B., 149: 26-33.
  • Mansour M., Naciri A.E., Johann L., Duguay S., Grob J.J., Stchakovsky M., Eypert C., 2006. Dielectric function of germanium nanocrystals between 0.6 and 6.5 eV by spectroscopic ellipsometry, Journal of Physics and Chemistry Solids, 67:1291-1300.
  • Jellison G.E., 2004. Generalized ellipsometry for materials characterization, Thin Solid Films 450: 42-47.
  • Khoshman J.M., Kordesch M.E., 2005. Bandgap engineering in amorphous BexZnyO thin films Journal of Non-Crystal Solids, 351:3334-3340.
  • Castilloa S.J., Mendoza-Galv nc A., amı rez-Bonc ., Espinoza-Beltr nc .J., Sotelo-Lermab M., Gonz lez-Hern ndezc J., Martı nez G., 000. Structural, optical and electrical characterization of In/CdS/glass thermally annealed system, Thin Solid Films, 373: 10-14.
  • Podesta A., Armani N., Salviati G., Romeo N., Bosio A., Prato M., 2006. Influence of the fluorine doping on the optical properties of CdS thin films for photovoltaic applications, Thin Solid Films, 511: 448-452.
  • Parmenter R.H., 1955. Energy levels of a disordered alloy, Physics Review Letters, 97: 587-698.
  • Melsheimer J., Ziegler O., 1985. Band gap energy and Urbach tail studies of amorphous, partially crystalline and polycrystalline tin dioxide, Thin Solid Films, 129: 35-37.
  • Tan S.T., Chen B.J., Sun X.W., Fan W.J., Kwok H.S., Zhang X.H., Chua S.J., 2005. Blueshift of optical band gap in ZnO thin films grown by metal-organic chemical-vapor deposition, Journal of Applied Physics, 98:013505(1-5).
  • Ferhunde Atay e-mail: fatay@ogu.edu.tr
  • İdris Akyüz e-mail: iakyuz@ogu.edu.tr
There are 34 citations in total.

Details

Primary Language English
Subjects Metrology, Applied and Industrial Physics
Journal Section Makaleler
Authors

Olcay Gençyılmaz

Ferhunde Atay

İdris Akyüz

Publication Date December 31, 2014
Published in Issue Year 2014 Volume: 9 Issue: 2

Cite

IEEE O. Gençyılmaz, F. Atay, and İ. Akyüz, “Variable-Angle Spectroellipsometric Characterization of CdS Thin Films”, Süleyman Demirel University Faculty of Arts and Science Journal of Science, vol. 9, no. 2, pp. 137–146, 2014.