Research Article

Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications

Volume: 28 Number: 2 August 23, 2024
TR EN

Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications

Abstract

In this investigation, the sol-gel spin coating technique was utilized to fabricate ZnO and ZnO films doped with Iridium (Ir) onto p-Si substrates. The objective was to analyze their optical and morphological characteristics and assess their potential for heterojunction applications. Morphological inspection and optical evaluation were carried out by Atomic Force Microscopy (AFM) and Ultraviolet-visible (UV-VIS) studies, respectively. With the incorporation of Ir, the optical band gap of ZnO films reduced from 3.21 eV to 3.08 eV. Analysis of AFM images revealed that Ir substitution led to a reduction in the roughness of the surface of the fabricated films. The optoelectrical features of the heterojunction structures were examined under varying illumination levels and in dark conditions. Upon evaluating the optoelectrical characteristics of the produced diodes, it was observed that the ideality factor (n) and the barrier height declined, while series resistance (Rs) increased with the introduction of Ir. These findings emphasize that the inclusion of Ir into the ZnO structure has a discernible impact on optical parameters.

Keywords

References

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Details

Primary Language

English

Subjects

Electronic, Optics and Magnetic Materials, Material Characterization

Journal Section

Research Article

Publication Date

August 23, 2024

Submission Date

August 18, 2023

Acceptance Date

January 18, 2024

Published in Issue

Year 2024 Volume: 28 Number: 2

APA
Aksoy Pehlivanoglu, S., & Polat, Ö. (2024). Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications. Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi, 28(2), 96-104. https://doi.org/10.19113/sdufenbed.1345637
AMA
1.Aksoy Pehlivanoglu S, Polat Ö. Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications. J. Nat. Appl. Sci. 2024;28(2):96-104. doi:10.19113/sdufenbed.1345637
Chicago
Aksoy Pehlivanoglu, Seval, and Özgür Polat. 2024. “Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications”. Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi 28 (2): 96-104. https://doi.org/10.19113/sdufenbed.1345637.
EndNote
Aksoy Pehlivanoglu S, Polat Ö (August 1, 2024) Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications. Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi 28 2 96–104.
IEEE
[1]S. Aksoy Pehlivanoglu and Ö. Polat, “Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications”, J. Nat. Appl. Sci., vol. 28, no. 2, pp. 96–104, Aug. 2024, doi: 10.19113/sdufenbed.1345637.
ISNAD
Aksoy Pehlivanoglu, Seval - Polat, Özgür. “Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications”. Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi 28/2 (August 1, 2024): 96-104. https://doi.org/10.19113/sdufenbed.1345637.
JAMA
1.Aksoy Pehlivanoglu S, Polat Ö. Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications. J. Nat. Appl. Sci. 2024;28:96–104.
MLA
Aksoy Pehlivanoglu, Seval, and Özgür Polat. “Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications”. Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi, vol. 28, no. 2, Aug. 2024, pp. 96-104, doi:10.19113/sdufenbed.1345637.
Vancouver
1.Seval Aksoy Pehlivanoglu, Özgür Polat. Characterization and Optoelectronic Effects of Iridium Doped ZnO Thin Films for Heterojunction Applications. J. Nat. Appl. Sci. 2024 Aug. 1;28(2):96-104. doi:10.19113/sdufenbed.1345637

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