x-ışını kırınım yöntemleriyle kristal yapı çözümlemesi için yapılan hesaplamalarda, atom saçma faktörlerinin herhangi bir θ açısındaki değerinin bilinmesi gerekir. Bu değerin basit bir analitik fonksiyonla çabucak hesaplanması istenir. Bu çalışmada, atom saçma faktörlerinin s=sin θ/λ ile değişimini temsil eden bu analitik fonksiyonlardan ikisi karşılaştırmalı olarak incelenmiştir. Bu fonksiyonların parametrelere duyarlılıkları tartışılmıştır.
Calculation of crystal structure analysis by using x-ray diffraction methods requires the value of atomic scattering factors at any scattering angle θ. A simple analytical function is necessary for convenient calculation of these factors. In this study, two such functions to represent atomic scattering factors depending on s=sin θ/λ are comparatively investigated and their sensitivit y on the parameters are discussed.
Other ID | JA58CY24TU |
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Journal Section | Research Articles |
Authors | |
Publication Date | June 1, 2009 |
Submission Date | June 1, 2009 |
Published in Issue | Year 2009 Volume: 2 Issue: 34 |
Journal Owner: On behalf of Selçuk University Faculty of Science, Rector Prof. Dr. Hüseyin YILMAZ
Selcuk University Journal of Science Faculty accepts articles in Turkish and English with original results in basic sciences and other applied sciences. The journal may also include compilations containing current innovations.
It was first published in 1981 as "S.Ü. Fen-Edebiyat Fakültesi Dergisi" and was published under this name until 1984 (Number 1-4).
In 1984, its name was changed to "S.Ü. Fen-Edeb. Fak. Fen Dergisi" and it was published under this name as of the 5th issue.
When the Faculty of Letters and Sciences was separated into the Faculty of Science and the Faculty of Letters with the decision of the Council of Ministers numbered 2008/4344 published in the Official Gazette dated 3 December 2008 and numbered 27073, it has been published as "Selcuk University Journal of Science Faculty" since 2009.
It has been scanned in DergiPark since 2016.
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