Predicting of Combining Ability for Length,Width and Area of Flag Leaf and Grain Yield per Plant in Bread Wheat with Respect to Diallel Analysis
Abstract
Wheat is a major crop in Turkey where bread wheat production constitutes about 80 % of total cereal production (Anonymous, 2004; Anonymous, 2005). The crop has been grown at ratio 73 % about all of field crops areas and obtained 19 milyon ton production from growing area of 9,4 milyon hectare (Anonymous, 2004). The leaves, being the site of photosynthetic activity, appear to have an obvious relation to the plant’s grain yield ability ( Sharma et al. 2003a). Flag leaf makes a major contribution towards the grain weight (41–43 %) and is the major photosynhetic site during the grain filling period (Ibrahim and Elenein, 1977). Monyo ve Whittington (1973) have shown that leaf area is an indicator of potential grain yield in wheat and since the flag leaf plays a predominant role, it’s size is likely to be important. Diallel analysis of self- and cross populations is used to study the genetic control of quantitative traits (Jinks and Hayman,1953; Hayman,1954,1958) to asses general and specific combining abilities (Griffing 1956) and perform heterosis analysis (Gardner and Eberhart,1966; Gardner,1967). It allows to select superior pure lines for crossing and in crosspollinating species, to screen populations for use in a intra-and inter population breeding programs.
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References
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