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Predicting of Combining Ability for Length,Width and Area of Flag Leaf and Grain Yield per Plant in Bread Wheat with Respect to Diallel Analysis

Year 2006, Volume: 43 Issue: 1, 21 - 32, 01.03.2006

Abstract

Wheat is a major crop in Turkey where bread wheat production constitutes about 80 % of total cereal production (Anonymous, 2004; Anonymous, 2005). The crop has been grown at ratio 73 % about all of field crops areas and obtained 19 milyon ton production from growing area of 9,4 milyon hectare (Anonymous, 2004). The leaves, being the site of photosynthetic activity, appear to have an obvious relation to the plant’s grain yield ability ( Sharma et al. 2003a). Flag leaf makes a major contribution towards the grain weight (41–43 %) and is the major photosynhetic site during the grain filling period (Ibrahim and Elenein, 1977). Monyo ve Whittington (1973) have shown that leaf area is an indicator of potential grain yield in wheat and since the flag leaf plays a predominant role, it’s size is likely to be important. Diallel analysis of self- and cross populations is used to study the genetic control of quantitative traits (Jinks and Hayman,1953; Hayman,1954,1958) to asses general and specific combining abilities (Griffing 1956) and perform heterosis analysis (Gardner and Eberhart,1966; Gardner,1967). It allows to select superior pure lines for crossing and in crosspollinating species, to screen populations for use in a intra-and inter population breeding programs.

References

  • Anonymous. 2004. Republic of Turkey, Prime Ministry State Institute of Statistics.
  • http://www.die.gov.tr/yillik/yillik_2004_eng.pdf. Acces: January 2006.
  • Anonymous, 2005. Production Estimates and Crop Assessment Division Foreign Agricultural Service. http://www.fas.usda.gov/pecad/highlights/2005/07/ durum2005/durum%20tables .html Acces: February 2006.
  • Bariga, P.1980. Inheritance of photosynthetic areas above the flag leaf node in spring wheat. Plant Breeding Abstracts 50, 2712.
  • Brow, M. D and J. G. Coors. 1994. Diallel: A Microcomputer program for the simulation and analysis of diallel crosses. Agron.J.,86 (1): 154-159.
  • Brown, C.N. and R.O. Weibel, R.D. Seif. 1996. Heterosis and combining ability in common winter wheat, Crop. Sci. 6:392-383.
  • Cruz, C.D. and -Vencovsky,R.1989. Compparocao de algunsmetodos de analise dialelica. Rev. Bras Genet 12:425-438.
  • Gardner,C.O., S.A. Eberhart. 1966. Analysis and interpretation of the variety Cross Diallel and related populations. Biometrics 22: 439-452.
  • Gardner,C.O.1967. Simplified methods for estimating constants and computing sums of squares for a diallel cross analysis. Fitotec Latinoam 4:1-12.
  • Griffing, B. 1956. Concept of general and specific combining ability in relation to diallel crossing system. Aust.J. Biol. Sci.9:463-493.
  • Hayman, B.I. 1954 a. The theory and analysis of diallel crosses,Genetics, 39:789-809.
  • Hayman, B.I. 1958.The theory and analysis of diallel croses.II.Genetics 43:63-65.
  • Ibrahim, H.A. and R.A. Elenein. 1977. The relative contribution of different wheat leaves and awns to the grain yield and its protein content. Z. Ack. Pflanz 144: 1-7.
  • Jinks, J.L., B.I. Hayman. 1953. The Analysis of diallel crosses. Maize Crop Newslett 27:48-54.
  • Kashif, M., Khaliq. 2004. Manifestation of Heterosis for Some Metric Characters in Intraspecific crosses of Triticum aestivum L. International Journal of Agriculture and Biology. Vol.6, No.1p.132-137.
  • Kempthorne, O., R.N. Curnow. 1961. The Partial diallel cross. Biometrics. P.229-250.
  • Kılınç, M., 2001. The determination of combining ability of some agricultural characters at wheat breads. Mustafa Kemal University, The journal of Faculty of Agriculture 6 (1-2) :51-60. Hatay.
  • Li, L.Z., D.B. Lu.,D and Q. Cui. 1991. Study on the combining ability for yield and quality characters in winter wheat. Plant Breding Abst.(1994), 3:1.
  • Lupton, F.G.H. 1973. Selection criteria determining yield in semi dwarf wheat varieties. Ann. Appl.Biol. 72: 47-50. In: Sharma, SN., R.S. Sain and R.K. Sharma. 2003a. The genetic control of the flag leaf length in normal and late sown durum wheat. Journal of Agricultural Science 141:323-331.
  • Menon, U and S.N. Sharma,1995. Inheritance studies for yield and yield component traits in bread wheat over envinronments.Wheat Information Service 80, 1-5.
  • Monyo, J.H and W.J. Whittington. 1973. Genotypic differences in flag leaf area and their contribution to grain yield in wheat. Euphytica 22: 600-606.
  • Sharma, S.N., R.S. Sain and R.K. Sharma. 2003. Genetic analysis of flag leaf area in durum wheat over environments. Wheat Inf.Serv. India :96: 5-10.
  • Sharma, SN., R.S. Sain and R.K. Sharma. 2003a. The genetic control of the flag leaf length in normal and late sown durum wheat. Journal of Agricultural Science 141:323-331.
  • Simpson., G.M. 1968. Association between grain yield per plant and photosynthetic area above the flag leaf node in wheat. Canadian J.Pl. Science 48:117-183.
  • Steel, R.G.D., and J.H.Torrie. 1985. Principles and procedures of statistics. Second Edition. Mc. Graw- Hill Book Company Inc., New- York.
  • Viana, J.M.S. 2000. The parametric restrictions of the Griffing diallel analysis model: Combining ability analysis. Genet Mol Biol 23:877-881.
  • Yıldırım, M.B, 1977. Diallel analysis of four Agronomic traits in common wheat. In: Muhammed., A., Aksel R. and Borstel, R:C, 1977. Genetic diversity in plants. Plenium Pres. New York and London..
  • Whitehouse, R.N.H.,J.B. Thompson, M.A.M. Vale Riberio. 1958. Studies on the breeding of self- pollinating cereals. 2. The Use of diallel cross analysis in yield production. Euphytica 7:147-178.

Ekmeklik Buğdaylarda Bayrak Yaprak Uzunluğu, Genişliği, Alanı ve Bitki Başına Tane Verimi Özelliklerinin Diallel Analiz Yöntemi ile Kombinasyon Yeteneklerinin Tahmini

Year 2006, Volume: 43 Issue: 1, 21 - 32, 01.03.2006

Abstract

Ekmeklik Buğdaylarda Bayrak Yaprak Uzunluğu, Genişliği, Alanı ve Bitki Başına Tane Verimi Özelliklerinin Diallel Analiz Yöntemi ile Kombinasyon Yeteneklerinin Tahmini Ekmeklik buğdaylarda sekiz ebeveynde diallel melezleme yoluyla bayrak yaprak uzunluğu, genişliği, alanı ve bitki başına tane verimi özellikleri için kombinasyon yetenekleri incelenmiştir.Genel kombinasyon etkileri bitki başına dane verimi dışında diğer özellikler için istatistiksel olarak önemli bulunurken, özel kombinasyon etkileri incelenen tüm özellikler için önemli bulunmuştur (P

References

  • Anonymous. 2004. Republic of Turkey, Prime Ministry State Institute of Statistics.
  • http://www.die.gov.tr/yillik/yillik_2004_eng.pdf. Acces: January 2006.
  • Anonymous, 2005. Production Estimates and Crop Assessment Division Foreign Agricultural Service. http://www.fas.usda.gov/pecad/highlights/2005/07/ durum2005/durum%20tables .html Acces: February 2006.
  • Bariga, P.1980. Inheritance of photosynthetic areas above the flag leaf node in spring wheat. Plant Breeding Abstracts 50, 2712.
  • Brow, M. D and J. G. Coors. 1994. Diallel: A Microcomputer program for the simulation and analysis of diallel crosses. Agron.J.,86 (1): 154-159.
  • Brown, C.N. and R.O. Weibel, R.D. Seif. 1996. Heterosis and combining ability in common winter wheat, Crop. Sci. 6:392-383.
  • Cruz, C.D. and -Vencovsky,R.1989. Compparocao de algunsmetodos de analise dialelica. Rev. Bras Genet 12:425-438.
  • Gardner,C.O., S.A. Eberhart. 1966. Analysis and interpretation of the variety Cross Diallel and related populations. Biometrics 22: 439-452.
  • Gardner,C.O.1967. Simplified methods for estimating constants and computing sums of squares for a diallel cross analysis. Fitotec Latinoam 4:1-12.
  • Griffing, B. 1956. Concept of general and specific combining ability in relation to diallel crossing system. Aust.J. Biol. Sci.9:463-493.
  • Hayman, B.I. 1954 a. The theory and analysis of diallel crosses,Genetics, 39:789-809.
  • Hayman, B.I. 1958.The theory and analysis of diallel croses.II.Genetics 43:63-65.
  • Ibrahim, H.A. and R.A. Elenein. 1977. The relative contribution of different wheat leaves and awns to the grain yield and its protein content. Z. Ack. Pflanz 144: 1-7.
  • Jinks, J.L., B.I. Hayman. 1953. The Analysis of diallel crosses. Maize Crop Newslett 27:48-54.
  • Kashif, M., Khaliq. 2004. Manifestation of Heterosis for Some Metric Characters in Intraspecific crosses of Triticum aestivum L. International Journal of Agriculture and Biology. Vol.6, No.1p.132-137.
  • Kempthorne, O., R.N. Curnow. 1961. The Partial diallel cross. Biometrics. P.229-250.
  • Kılınç, M., 2001. The determination of combining ability of some agricultural characters at wheat breads. Mustafa Kemal University, The journal of Faculty of Agriculture 6 (1-2) :51-60. Hatay.
  • Li, L.Z., D.B. Lu.,D and Q. Cui. 1991. Study on the combining ability for yield and quality characters in winter wheat. Plant Breding Abst.(1994), 3:1.
  • Lupton, F.G.H. 1973. Selection criteria determining yield in semi dwarf wheat varieties. Ann. Appl.Biol. 72: 47-50. In: Sharma, SN., R.S. Sain and R.K. Sharma. 2003a. The genetic control of the flag leaf length in normal and late sown durum wheat. Journal of Agricultural Science 141:323-331.
  • Menon, U and S.N. Sharma,1995. Inheritance studies for yield and yield component traits in bread wheat over envinronments.Wheat Information Service 80, 1-5.
  • Monyo, J.H and W.J. Whittington. 1973. Genotypic differences in flag leaf area and their contribution to grain yield in wheat. Euphytica 22: 600-606.
  • Sharma, S.N., R.S. Sain and R.K. Sharma. 2003. Genetic analysis of flag leaf area in durum wheat over environments. Wheat Inf.Serv. India :96: 5-10.
  • Sharma, SN., R.S. Sain and R.K. Sharma. 2003a. The genetic control of the flag leaf length in normal and late sown durum wheat. Journal of Agricultural Science 141:323-331.
  • Simpson., G.M. 1968. Association between grain yield per plant and photosynthetic area above the flag leaf node in wheat. Canadian J.Pl. Science 48:117-183.
  • Steel, R.G.D., and J.H.Torrie. 1985. Principles and procedures of statistics. Second Edition. Mc. Graw- Hill Book Company Inc., New- York.
  • Viana, J.M.S. 2000. The parametric restrictions of the Griffing diallel analysis model: Combining ability analysis. Genet Mol Biol 23:877-881.
  • Yıldırım, M.B, 1977. Diallel analysis of four Agronomic traits in common wheat. In: Muhammed., A., Aksel R. and Borstel, R:C, 1977. Genetic diversity in plants. Plenium Pres. New York and London..
  • Whitehouse, R.N.H.,J.B. Thompson, M.A.M. Vale Riberio. 1958. Studies on the breeding of self- pollinating cereals. 2. The Use of diallel cross analysis in yield production. Euphytica 7:147-178.
There are 28 citations in total.

Details

Primary Language English
Journal Section Articles
Authors

Şahin Dere This is me

Metin Birkan Yıldırım This is me

Publication Date March 1, 2006
Submission Date November 25, 2015
Published in Issue Year 2006 Volume: 43 Issue: 1

Cite

APA Dere, Ş., & Yıldırım, M. B. (2006). Predicting of Combining Ability for Length,Width and Area of Flag Leaf and Grain Yield per Plant in Bread Wheat with Respect to Diallel Analysis. Journal of Agriculture Faculty of Ege University, 43(1), 21-32.

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