Polikristal SnO_2 İnce Filmin Kalınlık ve Optik Sabitlerinin Zarf Yöntemi ile Belirlenmesi

Öz

SnO₂ (kalay dioksit) ince film ticari cam alttaban üzerinde 420^oC’de püskürtme tekniği ile depolanmıştır. XRD analizleri SnO₂ ince filmin tetragonal rutil yapıya sahip olduğunu göstermiştir. Filmin optik geçirgenlik değerleri (% T) görünür bölgede % 80-96 aralığındadır ve son derece şeffaftır. Soğurma katsayıları (α) geçirgenlik spektrumundan hesaplanmıştır. Kırılma indisleri (n) ve film kalınlığı (t) zarf yöntemi kullanılarak optik geçirgenlik eğrisinin girişimlerinden belirlenmiştir. Ultraviyole-görünür-yakın kızılötesi (UV-VIS-NIR) bölgelerinde kırılma indisleri (n) 1.83-1.97 aralığında değişmiştir. SnO₂ ince filmin kalınlığı (t) ve optik enerji aralığı, sırasıyla 1.22 μm ve 3.98 eV olarak bulunmuştur.

Anahtar Kelimeler

• Püskürtme tekniği,Zarf yöntemi,Optik sabitler,Optik sabitler,SnO_2 ince film

Determination of The Thickness and Optical Constants of Polycrystalline SnO_2 Thin Film by Envelope Method

Öz

SnO₂ (tin dioxide) thin film was deposited on commercial glass substrate by spray pyrolysis technique at 420^oC. The XRD analyses indicated that the SnO₂ thin film is found to tetragonal rutile structure. Optical transmission values (T %) of the film are the range of 80-96 % in the visible region and its highly transparent. The absorption coefficients (α) were defined from transmission spectrum. Refractive indices (n) and film thickness (t) were determined from interferences of the optical transmission curve with envelope method. The refractive indices (n) were altered between 1.83-1.97 in the ultraviolet-visible-near-infrared (UV-VIS-NIR) regions. The thickness (t) and optical energy gap (E_g) of the SnO₂ thin film were found to be 1.22 μm and 3.98 eV, respectively.

Anahtar Kelimeler

• Spray pyrolysis technique,Envelope method,Optical constants,SnO_2 thin film

Kaynakça

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