Polikristal SnO_2 İnce Filmin Kalınlık ve Optik Sabitlerinin Zarf Yöntemi ile Belirlenmesi

Yıl 2018, Cilt: 8 Sayı: 2, 141 - 151, 28.12.2018

Özge Erken , Cebrail Gümüş

Öz

SnO₂ (kalay
dioksit) ince film ticari cam alttaban üzerinde 420^oC’de püskürtme tekniği
ile depolanmıştır. XRD
analizleri SnO₂ ince filmin tetragonal rutil yapıya sahip olduğunu
göstermiştir. Filmin optik geçirgenlik değerleri (% T) görünür bölgede % 80-96 aralığındadır
ve son derece şeffaftır. Soğurma
katsayıları (α)
geçirgenlik spektrumundan hesaplanmıştır. Kırılma indisleri (n) ve film kalınlığı (t) zarf yöntemi kullanılarak optik geçirgenlik
eğrisinin girişimlerinden belirlenmiştir. Ultraviyole-görünür-yakın kızılötesi
(UV-VIS-NIR) bölgelerinde kırılma indisleri (n) 1.83-1.97 aralığında değişmiştir. SnO₂ ince filmin
kalınlığı (t) ve optik enerji
aralığı, sırasıyla 1.22
μm
ve 3.98 eV olarak bulunmuştur.

Anahtar Kelimeler

Püskürtme tekniği, Zarf yöntemi, Optik sabitler, Optik sabitler, SnO_2 ince film

Determination of The Thickness and Optical Constants of Polycrystalline SnO_2 Thin Film by Envelope Method

Öz

SnO₂ (tin
dioxide) thin film was deposited on commercial
glass substrate by spray pyrolysis technique at 420^oC. The
XRD analyses indicated that the SnO₂ thin film is found to
tetragonal rutile structure. Optical transmission values (T %) of the film are the range of 80-96 % in the visible region and
its highly transparent. The absorption coefficients (α)
were defined from transmission spectrum. Refractive indices
(n) and film thickness (t) were determined from interferences of the optical
transmission curve with envelope method. The refractive indices (n) were altered between 1.83-1.97 in the
ultraviolet-visible-near-infrared (UV-VIS-NIR) regions. The thickness (t) and optical energy gap (E_g) of the SnO₂
thin film were found to be 1.22 μm
and 3.98 eV, respectively.

Anahtar Kelimeler

Spray pyrolysis technique, Envelope method, Optical constants, SnO_2 thin film

Kaynakça

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