Research Article

Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy

Volume: 11 Number: 3 September 30, 2022
EN

Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy

Abstract

The fluorescence spectroscopy technique was used to measure the residual stress between the cathode and electrolyte of an anode supported planar single-chamber solid oxide fuel cell. The cell was made of (NiO-CGO) :(CGO) :(LSCF-CGO), as anode:electrolyte:cathode and the test was carried out after sintering at room temperature. The measured stress between these layers arises from the sintering stress caused by differential shrinkage from layers during sintering and the thermal expansion co-efficient mismatch between the layers during cooling. Therefore, the residual stress in the cathode and electrolyte layer of the cell due to co-efficient of thermal expansion mismatch during cooling was calculated analytically so as to find sintering stress. According to findings a maximum compressive residual stress of -1084 MPa occurred at the place contiguous to electrolyte layer. The estimated residual stresses in the cell’s cathode and electrolyte layer owing to CTE mismatch for the duration of cooling was calculated as -324 MPa and 15.96 MPa, respectfully. Furthermore, total mean residual compressive stress between cathode and electrolyte was obtained from fluorescence spectroscopy as -703.795. Thus, the main contribution of this residual stress is the stress growth during sintering (-395.755 MPa) due to different shrinkage behavior of adjacent layers.

Keywords

References

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Details

Primary Language

English

Subjects

Engineering

Journal Section

Research Article

Publication Date

September 30, 2022

Submission Date

July 2, 2022

Acceptance Date

September 23, 2022

Published in Issue

Year 2022 Volume: 11 Number: 3

APA
Sayan, Y., Kim, J.- sik, & Wu, H. (2022). Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi, 11(3), 902-910. https://doi.org/10.17798/bitlisfen.1139679
AMA
1.Sayan Y, Kim J sik, Wu H. Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi. 2022;11(3):902-910. doi:10.17798/bitlisfen.1139679
Chicago
Sayan, Yunus, Jung-sik Kim, and Houzheng Wu. 2022. “Residual Stress Measurement of a Single-Step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy”. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi 11 (3): 902-10. https://doi.org/10.17798/bitlisfen.1139679.
EndNote
Sayan Y, Kim J- sik, Wu H (September 1, 2022) Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi 11 3 902–910.
IEEE
[1]Y. Sayan, J.- sik Kim, and H. Wu, “Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy”, Bitlis Eren Üniversitesi Fen Bilimleri Dergisi, vol. 11, no. 3, pp. 902–910, Sept. 2022, doi: 10.17798/bitlisfen.1139679.
ISNAD
Sayan, Yunus - Kim, Jung-sik - Wu, Houzheng. “Residual Stress Measurement of a Single-Step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy”. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi 11/3 (September 1, 2022): 902-910. https://doi.org/10.17798/bitlisfen.1139679.
JAMA
1.Sayan Y, Kim J- sik, Wu H. Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi. 2022;11:902–910.
MLA
Sayan, Yunus, et al. “Residual Stress Measurement of a Single-Step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy”. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi, vol. 11, no. 3, Sept. 2022, pp. 902-10, doi:10.17798/bitlisfen.1139679.
Vancouver
1.Yunus Sayan, Jung-sik Kim, Houzheng Wu. Residual Stress Measurement of a Single-step Sintered Planar Anode Supported SC-SOFC Using Fluorescence Spectroscopy. Bitlis Eren Üniversitesi Fen Bilimleri Dergisi. 2022 Sep. 1;11(3):902-10. doi:10.17798/bitlisfen.1139679

Cited By

Bitlis Eren University

Journal of Science Editor

Bitlis Eren University Graduate Institute

Bes Minare Mah. Ahmet Eren Bulvari, Merkez Kampus, 13000 BITLIS

E-mail: fbe@beu.edu.tr