Kırıs, G. K., & Özkol, İ. (2012). DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS. IU-Journal of Electrical & Electronics Engineering, 2(2), 505-512.
AMA
Kırıs GK, Özkol İ. DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS. IU-Journal of Electrical & Electronics Engineering. Ocak 2012;2(2):505-512.
Chicago
Kırıs, Güven Kömürgöz, ve İbrahim Özkol. “DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS”. IU-Journal of Electrical & Electronics Engineering 2, sy. 2 (Ocak 2012): 505-12.
EndNote
Kırıs GK, Özkol İ (01 Ocak 2012) DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS. IU-Journal of Electrical & Electronics Engineering 2 2 505–512.
IEEE
G. K. Kırıs ve İ. Özkol, “DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS”, IU-Journal of Electrical & Electronics Engineering, c. 2, sy. 2, ss. 505–512, 2012.
ISNAD
Kırıs, Güven Kömürgöz - Özkol, İbrahim. “DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS”. IU-Journal of Electrical & Electronics Engineering 2/2 (Ocak2012), 505-512.
JAMA
Kırıs GK, Özkol İ. DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS. IU-Journal of Electrical & Electronics Engineering. 2012;2:505–512.
MLA
Kırıs, Güven Kömürgöz ve İbrahim Özkol. “DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS”. IU-Journal of Electrical & Electronics Engineering, c. 2, sy. 2, 2012, ss. 505-12.
Vancouver
Kırıs GK, Özkol İ. DETERMINATION OF TEMPERATURE DISTRIBUTION IN THE DISC-TYPE COIL OF TRANSFORMER WINDINGS VIA NUMERICAL-ANALYTICAL METHODS. IU-Journal of Electrical & Electronics Engineering. 2012;2(2):505-12.