BibTex RIS Kaynak Göster

IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK

Yıl 2002, Cilt: 2 Sayı: 2, 537 - 539, 09.01.2012

Osman Nuri Ucan Abdullah Bal Muharrem Mercimek

Öz

IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK

Anahtar Kelimeler

-

Yıl 2002, Cilt: 2 Sayı: 2, 537 - 539, 09.01.2012

Osman Nuri Ucan Abdullah Bal Muharrem Mercimek

Öz

Toplam 0 adet kaynakça vardır.

Ayrıntılar

Birincil Dil İngilizce
Yazarlar

Osman Nuri Ucan Bu kişi benim

Abdullah Bal Bu kişi benim

Muharrem Mercimek

Yayımlanma Tarihi 9 Ocak 2012
Yayımlandığı Sayı Yıl 2002 Cilt: 2 Sayı: 2

Kaynak Göster

APA Ucan, O. N., Bal, A., & Mercimek, M. (2012). IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK. IU-Journal of Electrical & Electronics Engineering, 2(2), 537-539.
AMA Ucan ON, Bal A, Mercimek M. IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK. IU-Journal of Electrical & Electronics Engineering. Ocak 2012;2(2):537-539.
Chicago Ucan, Osman Nuri, Abdullah Bal, ve Muharrem Mercimek. “IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK”. IU-Journal of Electrical & Electronics Engineering 2, sy. 2 (Ocak 2012): 537-39.
EndNote Ucan ON, Bal A, Mercimek M (01 Ocak 2012) IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK. IU-Journal of Electrical & Electronics Engineering 2 2 537–539.
IEEE O. N. Ucan, A. Bal, ve M. Mercimek, “IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK”, IU-Journal of Electrical & Electronics Engineering, c. 2, sy. 2, ss. 537–539, 2012.
ISNAD Ucan, Osman Nuri vd. “IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK”. IU-Journal of Electrical & Electronics Engineering 2/2 (Ocak2012), 537-539.
JAMA Ucan ON, Bal A, Mercimek M. IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK. IU-Journal of Electrical & Electronics Engineering. 2012;2:537–539.
MLA Ucan, Osman Nuri vd. “IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK”. IU-Journal of Electrical & Electronics Engineering, c. 2, sy. 2, 2012, ss. 537-9.
Vancouver Ucan ON, Bal A, Mercimek M. IMAGE FUTURE EXTRACTON USING DYNAMIC NEURAL NETWORK. IU-Journal of Electrical & Electronics Engineering. 2012;2(2):537-9.