In this study, CuS thin films were successfully coated on glass
substrate at room temperature using successive ionic layer absorption and
reaction (SILAR) method. Thickness and solution concentration parameters which
are important in SILAR management were used to obtain CuS thin films. X-Ray
diffraction spectroscopy (XRD), Scanning Electron Microscopy (SEM) / Energy
Spread X-ray Spectroscopy (EDX) were used to examine the changes in thickness
and solution concentration in the structure of CuS thin films. Because of the
investigations, it was found that CuS thin films improved both the number of
cycles and the concentration of the solution and that the crystal structure
improved and the SEM / EDX results supported this result.
Birincil Dil | İngilizce |
---|---|
Bölüm | Makaleler |
Yazarlar | |
Yayımlanma Tarihi | 28 Temmuz 2019 |
Yayımlandığı Sayı | Yıl 2019 Cilt: 3 Sayı: 3 |