Araştırma Makalesi

INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES

Cilt: 10 Sayı: 2 31 Aralık 2024
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INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES

Öz

In this work, the polyacrylonitrile polymer was coated on top of p-Si by two different techniques, and the electrical characterization of the fabricated devices was held. Screen-printing and spin coating techniques were used to fabricate the metal/polymer/semiconductor devices, and the devices were finished with Ohmic contact of aluminum on the Si side, and with silver on the polymer side by using evaporation via chemical vapor deposition. The dark current - voltage and frequency dependent capacitance - voltage measurements of the fabricated Metal Polymer Semiconductor structure have been performed. Current and voltage measurements were carried out in the dark and in the voltage range of -2.0 V to +2.0 V. Capacitance voltage measurements were carried out in the dark, in the voltage range of -4.0 V to +4.0 V, and in the frequency range of 20 kHz to 1 MHz. The results of electrical characterization have been discussed in view of rectification of devices, interface states, interface dipoles, conduction of carriers, polarization mechanism, and relaxation process.

Anahtar Kelimeler

Destekleyen Kurum

Herhangi bir kurum tarafından finansal destek almamıştır.

Etik Beyan

Bu çalışmada herhangi bir etik beyan gerekliliği bulunmamaktadır.

Teşekkür

Deneysel aşamadaki katkılarından dolayı Dr. Osman Pakma ve Dr. Özcan Birgi'ye teşekkürlerimi sunarım.

Kaynakça

  1. Sevgili, Ö., Taşçıoğlu, İ., Boughdachi, S., Azizian-Kalandaragh, Y., and Altındal, Ş., “Examination of Dielectric Response of Au/HgS-PVA/n-Si (MPS) structure by Impedance Spectroscopy Method”, Phys. B Condens. Matter., 566, 125-135, 2019.
  2. Uluşan, A.B., and Tataroğlu, A., “Frequency-Dependent Dielectric Parameters of Au/TiO2/n-Si (MIS) Structure”, Silicon, 10(5), 2071-2077, 2018.
  3. Ataseven, T., and Tataroǧlu, A., “Temperature-Dependent Dielectric Properties of Au/Si3N4/n-Si (Metal - Insulator - Semiconductor) Structures”, Chinese Phys. B, 22(11), 117310, 2013.
  4. Buyukbas-Ulusan, A., Taşçıoğlu, İ., Tataroğlu, A., Yakuphanoğlu, F., and Altındal, S., “A Comparative Study on the Electrical and Dielectric Properties of Al/Cd-Doped ZnO/p-Si Structures”, J. Mater. Sci.: Mater. Electron., 30(13), 12122–12129, 2019.
  5. Shahbazi, M., Bahari, A., and Ghasemi, S., “Structural and Frequency-Dependent Dielectric Properties of PVP-SiO2-TMSPM Hybrid Thin Films”, Org. Electron., 32, 100-108, 2016.
  6. Lim, L.W., Aziz, F., Muhammad, F.F., Supangat, A., and Sulaiman, K., “Electrical Properties of Al/PTB7-Th/n-Si Metal-Polymer-Semiconductor Schottky Barrier Diode”, Synth. Met., 221, 169-175, 2016.
  7. Özden, Ş., Avcı, N., Pakma, O., and Kariper, I.A., “Influence of Illumination Intensity on the Electrical Properties of Al/NOA65/p-Si/Al Heterojunction MPS Device”, J. Mater. Sci.: Mater. Electron., 33(16), 12796-12807, 2022.
  8. Wong, C.H., Lam, L.Y.F., Hu, X., Tsui, C.P., and Zatsepin, A.F., “Schottky-Diode Design for Future High-Speed Telecommunications”, Nanomater., 13(9), 1448, 2023.

Ayrıntılar

Birincil Dil

İngilizce

Konular

Yarı İletkenler, Malzeme Karekterizasyonu, Polimer Fiziği

Bölüm

Araştırma Makalesi

Yayımlanma Tarihi

31 Aralık 2024

Gönderilme Tarihi

17 Temmuz 2024

Kabul Tarihi

24 Ekim 2024

Yayımlandığı Sayı

Yıl 2024 Cilt: 10 Sayı: 2

Kaynak Göster

APA
Koçak, Ç. (2024). INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES. Mugla Journal of Science and Technology, 10(2), 13-20. https://doi.org/10.22531/muglajsci.1517897
AMA
1.Koçak Ç. INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES. MJST. 2024;10(2):13-20. doi:10.22531/muglajsci.1517897
Chicago
Koçak, Çağdaş. 2024. “INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES”. Mugla Journal of Science and Technology 10 (2): 13-20. https://doi.org/10.22531/muglajsci.1517897.
EndNote
Koçak Ç (01 Aralık 2024) INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES. Mugla Journal of Science and Technology 10 2 13–20.
IEEE
[1]Ç. Koçak, “INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES”, MJST, c. 10, sy 2, ss. 13–20, Ara. 2024, doi: 10.22531/muglajsci.1517897.
ISNAD
Koçak, Çağdaş. “INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES”. Mugla Journal of Science and Technology 10/2 (01 Aralık 2024): 13-20. https://doi.org/10.22531/muglajsci.1517897.
JAMA
1.Koçak Ç. INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES. MJST. 2024;10:13–20.
MLA
Koçak, Çağdaş. “INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES”. Mugla Journal of Science and Technology, c. 10, sy 2, Aralık 2024, ss. 13-20, doi:10.22531/muglajsci.1517897.
Vancouver
1.Çağdaş Koçak. INVESTIGATION OF ELECTRICAL PROPERTIES OF Al/PAN/p-Si MPS DEVICES FABRICATED BY SPIN COATING AND SCREEN-PRINTING TECHNIQUES. MJST. 01 Aralık 2024;10(2):13-20. doi:10.22531/muglajsci.1517897

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Mugla Journal of Science and Technology (MJST) dergisi Creative Commons Atıf-GayriTicari 4.0 Uluslararası Lisansı ile lisanslanmıştır.