Kimyasal Püskürtme Tekniği ile Üretilen PbS İnce Filmin Karakterizasyonu

Year 2021, , 770 - 777, 31.12.2021

Sema Kurtaran

https://doi.org/10.35193/bseufbd.956725

Cited By: 1

Abstract

Bu çalışmada, kurşun sülfür (PbS) filmler, kolay ve ekonomik bir yöntem olan ultrasonik kimyasal püskürtme tekniği ile 370±5 °C taban sıcaklığında mikroskop cam üzerine kaplanmıştır. Farklı molariteli Pb katkısı ile elde edilen PbS filmlerin, yapısal, yüzeysel, optik ve elektriksel özellikleri üzerindeki etkisi incelendi. Optik, yapısal, yüzeysel ve elektriksel özellikleri, UV spektrofotometre, taramalı elektron mikroskobu, Atomik kuvvet mikroskobu ve X-ışını spektroskopisi analizi kullanılarak karakterize edildi. X-ışınları kırınımı (XRD) analizinden PbS ince filminin hekzagonal yapıya sahip olduğu bulundu. Atomik Kuvvet Mikroskobu (AFM) ölçümlerinden PbS ince filminin pürüzlülükleri belirlendi. Optik soğurma spektrumundan PbS ince filminin 1.69-1.89 eV’luk dar optik bant aralığına sahip olduğu belirlendi. Üretilen filmlerin kalınlık değerleri ise spektroskopik elipsometre tekniğinde Cauchy-Urbach modeli kullanılarak belirlendi. PbS filmlerinin fotovoltaik güneş pili uygulamaları için kullanım potansiyeli araştırılmıştır.

Keywords

Kurşun Sülfür (PbS), Kimyasal Püskürtme Yöntemi, İnce Film

Characterization of PbS Thin Film Produced by Chemical Spray Pyrolysis Technique

Abstract

In this study, lead sulfide (PbS) films were coated on microscope glass at the substrate temperature of 370±5 °C by ultrasonic chemical spray pyrolysis technique, which is an easy and economical method. The effect of PbS films obtained with different molarity Pb additions on their structural, surface, optical, and electrical properties was investigated. Their optical, structural, surface, and electrical properties were characterized using UV, spectrophotometer, scanning electron microscopy, Atomic force microscopy, and X-ray spectroscopy analyses. From the X-ray diffraction (XRD) analysis, the PbS thin film was found to have a hexagonal structure. The roughness of the PbS thin film was determined by Atomic Force Microscopy (AFM). From the optical absorption spectrum, it was calculated that the PbS thin film has a narrow optic band gap of 1.69-1.89 eV. The thickness values of the produced films were determined using the spectroscopic ellipsometry technique. The Cauchy-Urbach model was used to determine the thickness of the films. The potential for use of PbS films for photovoltaic solar cell applications was investigated.

Keywords

Lead Sulphide (PbS), Spray Pyrolysis, Thin Film

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