EN
TR
USING SEMICONDUCTOR DETECTORS IN X-RAY IMAGE
Abstract
Different detectors are being used in X-ray imaging. They can be classified as scintillation and semiconductor
detectors. In this study CsI and CdTe type detectors, which are especially used today in angiography,
have been compared. First, these detectors have been simulated in computer and experiments have been carried
out by applying two different tube techniques, which are usually used in angiography with an X-ray simulation
program. In this technique, firstly, low voltage (60 kVp) is applied to the tube with a copper sheet in front of it
that serves as an inherent filter. Then, higher voltage (120kVp) is applied to the tube with a copper and
aluminum sheets in front of the tube for the same purpose. Image is composed by evaluating different spectrums
obtained. These experiments have been repeated for different values of applied voltages and different type ad
thickness of inherent sheets. As a result of these experiments, it was found that the signal to noise ratio (SNR) of
the CdTe type detector is found to be approximately ten times greater than the CsI type detectors that are used
presently. From this profile, especially at X-rays monitoring field in the future, CdTe type detectors could be
used extensively at low energies.
Keywords
References
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Details
Primary Language
Turkish
Subjects
-
Journal Section
-
Publication Date
May 1, 2002
Submission Date
May 1, 2002
Acceptance Date
-
Published in Issue
Year 2002 Volume: 4 Number: 2
APA
Bayburt, S., & Bayburt, M. (2002). X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI. Dokuz Eylül Üniversitesi Mühendislik Fakültesi Fen Ve Mühendislik Dergisi, 4(2), 113-122. https://izlik.org/JA32AY79MD
AMA
1.Bayburt S, Bayburt M. X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI. DEUFMD. 2002;4(2):113-122. https://izlik.org/JA32AY79MD
Chicago
Bayburt, Sevil, and Mehmet Bayburt. 2002. “X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI”. Dokuz Eylül Üniversitesi Mühendislik Fakültesi Fen Ve Mühendislik Dergisi 4 (2): 113-22. https://izlik.org/JA32AY79MD.
EndNote
Bayburt S, Bayburt M (May 1, 2002) X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI. Dokuz Eylül Üniversitesi Mühendislik Fakültesi Fen ve Mühendislik Dergisi 4 2 113–122.
IEEE
[1]S. Bayburt and M. Bayburt, “X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI”, DEUFMD, vol. 4, no. 2, pp. 113–122, May 2002, [Online]. Available: https://izlik.org/JA32AY79MD
ISNAD
Bayburt, Sevil - Bayburt, Mehmet. “X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI”. Dokuz Eylül Üniversitesi Mühendislik Fakültesi Fen ve Mühendislik Dergisi 4/2 (May 1, 2002): 113-122. https://izlik.org/JA32AY79MD.
JAMA
1.Bayburt S, Bayburt M. X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI. DEUFMD. 2002;4:113–122.
MLA
Bayburt, Sevil, and Mehmet Bayburt. “X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI”. Dokuz Eylül Üniversitesi Mühendislik Fakültesi Fen Ve Mühendislik Dergisi, vol. 4, no. 2, May 2002, pp. 113-22, https://izlik.org/JA32AY79MD.
Vancouver
1.Sevil Bayburt, Mehmet Bayburt. X-IŞINI GÖRÜNTÜLEMEDE YARIİLETKEN DEDEKTÖRLERİN KULLANILMASI. DEUFMD [Internet]. 2002 May 1;4(2):113-22. Available from: https://izlik.org/JA32AY79MD