Non-Destructive Chemical Analyzes of Coating Materials in the Scanning Electron Microscope

Abstract

In this study, it is aimed to determine and distinguish the elements in the coating and the base material by performing non-destructive EDS analyzes on the coating surface of a sample whose content is unknown and coated with a different material. For this purpose, parameters such as the acceleration voltage, which can prevent the generation of mixed x-ray signals from different grains by affecting the interaction volume during EDS analyzes, and also process and live times, which are critical to use at appropriate values, were used. To obtain high peak resolution and accurate quantitative results, it was determined that the ideal process time is 5 (process time takes values between 1-6 from fast to slow), and the optimum live time is 80 s (analyzes were carried out at 10, 20, 50, 80, 120 and 180 s). EDS analyzes which were performed to the coating surface at 30, 25, 20, 15 and 10 kV acceleration voltage values in ideal process and live times showed that x-ray signals came from both the coating and the base materials in the 30-15 kV range and from only the coating at values below 15 kV. The problem of peak overlapping of different elements encountered in EDS spectra has been solved by the WDS-SEM technique, which has a higher peak resolution than EDS. As a result of the analyzes, it was determined that the base material was SiAlON and the coating material was TiCN.

Keywords

• Non-destructive chemical analysis
• EDS
• WDS

Kaplama Malzemelerin Taramalı Elektron Mikroskobunda Tahribatsız Kimyasal Analizleri

Abstract

Bu çalışmada, içeriği bilinmeyen ve yüzeyi farklı bir malzeme ile kaplanmış bir numunenin kaplama yüzeyine tahribatsız olarak EDS-SEM analizleri yapılarak kaplama ve altlık malzemelerde bulunan elementlerin belirlenmesi ve birbirinden ayırt edilmesi hedeflenmiştir. Bu amaç doğrultusunda, EDS analizleri sırasında etkileşim hacmini etkileyerek farklı tanelerden karışık bir şekilde x-ışını sinyallerinin elde edilmesini engelleyebilen hızlandırma voltajı ile uygun değerlerde kullanılmaları kritik bir önem taşıyan işlem ve EDS programına girilen analiz süreleri gibi parametrelerden faydalanılmıştır. Yüksek pik çözünürlüğü ve doğru nicel sonuçlar elde edebilmek için ideal işlem süresinin 5 (hızlıdan yavaşa 1-6 arasında değer alır), EDS programına girilen analiz süresinin ise 80 sn (analizler 10, 20, 50, 80, 120 ve 180 sn sürelerinde gerçekleştirildi) olduğu belirlenmiştir. İdeal işlem ve analiz sürelerinde kaplama yüzeyine 30, 25, 20, 15 ve 10 kV hızlandırma voltaj değerlerinde yapılan EDS analizleri x-ışını sinyallerinin 30-15 kV aralığında kaplama ve ana malzemeden, 15 kV altında ise sadece kaplamadan geldiğini göstermiştir. EDS spektrumlarında karşılaşılan farklı elementlerin pik çakışması problemi EDS’e göre daha yüksek pik çözünürlüğüne sahip olan WDS-SEM tekniğiyle çözülmüştür. Yapılan analizler ile altlık malzemenin SiAlON, kaplama malzemesinin ise TiCN olduğu tayin edilmiştir.

Keywords

• Tahribatsız kimyasal analiz
• EDS
• WDS

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