Experimental realization of electromigration at high power for copper wires

Year 2019, Volume: 3 Issue: 4, 158 - 167, 31.12.2019

İbrahim Mahariq , Svetlana Beryozkina

https://doi.org/10.30521/jes.616982

Cited By: 5

Abstract

The electromigration
phenomenon is a topical concern in all types of interconnects in power systems
for both low and high voltages, low and large power ranges, for instance, in
fabrication and manufacturing of Integrated Circuits, electronics of the power
modules, power grid interconnects etc. Due to distributed generation units, in
particular, renewable energy sources, which are commonly connected to already
existing infrastructures, the considered issues related to the electromigration
impact will result to a potential reduction of the electrical interconnection
failure risks. Thus, the design of the integrated systems has to perform at
highly efficient level with low probability of disconnections. The presented
study considers the effect of the electromigration in terms of the spatial
direction of the currents by observing directions of the sparks under certain
arrangements of copper wires’ connections. The experimental setup has been
developed in order to realize and observe the theoretical expectations. The
experimental results were conducted at around 500 A, and the corresponding
observations match theoretical expectations.

Keywords

Electromigration, High power, Interconnect reliability, Physical design

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