Investigation of The Effect of Pb Doping on MgO Thin Film

Abstract

In this study, the effect of Lead (Pb) additive on magnesium oxide (MgO) thin films produced on glass substrates using sequential ionic layer adsorption and reaction technique (SILAR) was investigated for the first time. Uv-vis Spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM) measurements were performed to examine how the optical, structural and morphological properties of the samples were affected. In the Uv-vis Spectroscopy analysis, it was recorded that the band gaps of the MgO samples decreased from 4 eV to 3.75 eV with the increase of Pb dopant concentrations. It also shows that the permeability values of MgO nanostructures increase with the increase of Pb contribution. According to XRD measurements, PbO formations were detected in MgO thin film samples due to the increase in Pb additive as well as the cubic structure of the samples. SEM measurements showed that, although all of the samples have a nanowire structure, they showed serious changes in their structure with the Pb additive. In the light of these results, it shows that Pb doping on MgO thin films can be obtained by using the SILAR deposition technique.

Keywords

• SILAR technique
• MgO thin film
• Pb doped

Pb Katkısının MgO İnce Film Üzerine Etkisinin İncelenmesi

Abstract

Bu çalışmada ilk kez Kurşun (Pb) katkı maddesinin ardışık iyonik tabaka adsorpsiyonu ve reaksiyon tekniği (SILAR) kullanılarak cam altlıklar üzerine üretilen Magnezyum oksit (MgO) ince filmler üzerindeki etkisi araştırılmıştır. Numunelerin optik, yapısal ve morfolojik özelliklerinin nasıl etkilendiğini incelemek için Uv-vis Spektroskopi, X-ışını kırınımı (XRD), ve taramalı elektron mikroskobu (SEM) ölçümleri yapılmıştır. Uv-vis Spektroskopi analizinde Pb katkı konsantrasyonlarının artması ile MgO numunelerinin bant boşluklarının 4 eV'den 3.75eV'ye düştüğü kaydedildi. Ayrıca Pb katkısının artmasıyla MgO nanoyapılarının geçirgenlik değerlerinin artmakta olduğunu göstermektedir. XRD ölçümlerine göre, numunelerin kübik yapısının yanı sıra Pb katkı maddesinin artması nedeniyle MgO ince film numunelerinde PbO oluşumları tespit edilmiştir. SEM ölçümleri, tüm numunelerin nanotel yapısına sahip olmasına rağmen, Pb katkı maddesi ile yapılarında ciddi değişiklikler olduğunu gösterdi. Bu sonuçlar ışığında, MgO ince filmler üzerinde Pb katkısının SILAR biriktirme tekniği kullanılarak elde edilebileceğini göstermektedir.

Keywords

• SILAR tekniği
• MgO ince film
• Pb katkısı

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