Kimyasal yöntem ile indirgenmiş grafen oksit sentezi ve karakterizasyonu

Year 2016, , 349 - 357, 01.08.2016

İsmail Tiyek , Utkay Dönmez , Behzat Yıldırım , Mehmet Hakkı Alma , Mehmet Sabri Ersoy , Şükrü Karataş , Mustafa Yazıcı

https://doi.org/10.16984/saufenbilder.29009

Cited By: 15

Abstract

Üstün elektrik, mekanik, termal ve optik özellikleri ile grafen, araştırmaların odağında bir materyaldir. İndirgenmiş grafen oksit (RGO) ise grafen elde etmenin en etkili yollarından birisidir. Bu çalışmada modifiye Hummers yöntemi ile sentezlenen grafen oksitlerin (GO) indirgenmesi ile RGO elde edilmiştir. SEM görüntülerinden saydam RGO yapıları tespit edilmiştir. EDX/SEM analizinde, karbon (C) oranı yaklaşık %89 olarak bulunmuştur. FT-IR sonuçları ile GO yapısında var olan hidroksil, karbonil, epoksi ve alkoksi bağlarının RGO yapısından uzaklaştığı anlaşılmaktadır. Raman spektroskopisinde yeni sp² yapıların oluştuğu ve düzenli yapı miktarının arttığını görülmüştür. XRD analizinde oksidasyon işlemi sırasında oluşan fonksiyonel grupların kimyasal işlem esnasında bozunmaları sonucu RGO’nun katmanları arası d-mesafesi 0,83 nm’den 0,36 nm’ye düştüğü görülmektedir. 

Keywords

Grafen, Grafen Oksit; Kimyasal Yöntem; İndirgenmiş Grafen Oksit

Synthesis of reduced graphene oxide by chemical method and its characterization

Abstract

More recently, graphene, having outstanding electrical, mechanical, thermal and optical properties, have become an important research topic. Reduced graphene oxide (RGO) is one of the most effective way to obtain the graphene. In this study, RGO was obtained by reduction of graphene oxide (GO) synthesized by a modified Hummers method. The transparent structures of RGO have been identified through SEM images. The ratio of carbon (C) was found to be approximately 89% by SEM/EDX analysis. It was proven by FT-IR analysis that hydroxyl, carbonyl, epoxy and alkoxy bonds in GO structure were removed from RGO structure. On the other hand, RAMAN spectroscopic studies showed that the new sp² structures occurred, and the amount of regular structures increased. XRD analysis indicated that d-spacing between the layers of RGO decreased from 0,83 nm to 0,36 nm due to the degradation of functional groups during the chemical process, which were formed in the oxidation process.

Keywords

graphene, graphene oxide, chemical method, reduced graphene oxide

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