For Graphene Oxide Synthesis Obtained by Modified Hummers Method: Part 1, X-Ray Diffraction Analysis

Öz

Graphene Oxide is a carbon-based material with 2-dimensional and oxygen-containing functional groups. In recent years, graphene oxide-based materials have attracted great interest by scientists. Properties of graphene oxide; Since it depends on its morphology, nature and reaction conditions, the properties of graphene oxide synthesized under different conditions are also different. Therefore, every graphene oxide synthesis study that enters the literature makes an important contribution. In this study, whether the syntheses obtained by changing the sodium nitrate concentration used in the Hummers method were successfully converted to graphene oxide and their changing structural properties were investigated by X-ray diffraction analysis. From the analysis results, it was determined that in the hexagonal graphite crystal; the characteristic sharp peak at 2θ:26.53° disappears after chemical oxidation and a new peak forms at 2θ:11.53°, the d layer spacing expands from 0.34 nm to 0.77 nm, the crystal diameter decreases from 34.56 nm to an average of 7.22 nm, and the number of layers decreases from an average of 102 to an average of 9. Accordingly, it can be said that the syntheses obtained under these conditions are graphene oxide samples with different properties and are in agreement with the literature.

Anahtar Kelimeler

• Graphite
• Graphene oxide
• Hummers Method
• Nanomaterial
• X-Ray Diffraction

Modifiye Hummers Yöntemi ile Elde Edilen Grafen Oksit Sentezleri İçin: Kısım 1, X Işını Difraksiyonu Analizi

Öz

Grafen Oksit, 2 boyutlu ve oksijen içeren fonksiyonel grupların yer aldığı karbon esaslı bir malzemedir. Son yıllarda grafen oksit esaslı malzemeler, bilim adamları tarafından çok büyük bir ilgi görmektedir. Grafen oksidin özellikleri; morfolojisine, doğasına ve reaksiyon şartlarına bağlı olmasından dolayı farklı şartlarda sentezlenen grafen oksidin özellikleri de farklı olmaktadır. Dolayısıyla literatüre giren her bir grafen oksit sentez çalışmasının önemli bir katkı sağlayabileceği düşünülmektedir. Bu çalışmada, Hummers yönteminde kullanılan sodyum nitrat konsantrasyonu değiştirilerek elde edilen sentezlerin başarılı bir şekilde grafen oksite dönüşüp dönüşmediği ve değişen yapısal özellikleri X ray Difraksiyonu analizi ile incelenmiştir. Analiz sonuçlarından hegzagonal grafit kristalinde; 2θ:26,53°'ye ait karakteristik keskin pikin, kimyasal oksidasyon sonrası kaybolup 2θ:11,53°’de yeni bir pikin oluştuğu, d tabaka aralığının 0,34 nm'den 0,77 nm'ye genişlediği, kristal çapın 34,56 nm’den ortalama 7,22 nm’ye azaldığı ve tabaka sayısının 102’den 9’a düştüğü belirlenmiştir. Sonuç olarak bu şartlarda elde edilen sentezlerin, farklı özelliklere sahip grafen oksit örnekleri olduğu ve literatür ile uyum içerisinde oldukları söylenebilir.

Anahtar Kelimeler

• Grafit
• Grafen oksit
• Hummers Yöntemi
• Nanomalzeme
• X-Ray Difraksiyonu

Kaynakça

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