Surfactant-Assisted Growth of Silver-Doped Cupric Oxide Thin Films Fabricated by SILAR Method

Abstract

In the present work, silver-doped cupric oxide (CuO) thin films have been deposited on glass substrates by a surfactant-assisted successive ionic layer adsorption and reaction (SILAR) technique at room temperature. The effects of different concentrations of silver from 0 to 3.0 M% on the structural, morphological, and optical properties of CuO thin films with sodium citrate surfactant were studied. The structural analysis of all produced thin films was performed with X-ray diffractometer (XRD). Structural analysis confirm that all the films were polycrystalline nature having a monoclinic crystalline form. The crystallite size values ranged from 14.83 to 17.09 nm depending on the concentration of silver doping in different proportions The surface morphology of CuO thin films was examined using metallurgical microscope studies. Surface studies showed that homogeneously distributed CuO nanostructures on the film surfaces. Optical analysis of all thin films were examined using UV-Vis-NIR spectrophotometer. The optical analysis results revealed that optical band gap energies of the CuO thin films increased from 1.34 to 1.72 eV with increasing molarity of silver concentration from 0 M to 2.0 M%. For further increase of molarity to 3.0 M%, the band gap energy decreased to 1.68 eV. The average transmittance of all the films had increased from 2.0 % to 32.5% with the increasing silver concentration.

Keywords

• CuO thin film
• doping
• surfactant
• silver
• SILAR

Gümüş Katkılı Bakır(II) Oksit İnce Filmlerin Yüzey Aktif Madde Yardımıyla SILAR Metoduyla Büyütülmesi

Öz

Bu çalışmada, gümüş (Ag) katkılı bakır(II) oksit (CuO) ince filmler, cam yüzeyler üzerinde, oda sıcaklığında bir yüzey aktif maddesi yardımıyla ardışık iyonik tabaka adsorpsiyon ve reaksiyon (SILAR) tekniği ile büyütülmüştür. Farklı konsantrasyonlardaki Ag’nin (0 % ila  3.0 M%) sodyum sitrat yüzey aktif maddesi içeren CuO ince filmlerin yapısal, morfolojik ve optiksel özellikleri üzerindeki etkileri incelenmiştir. Üretilen tüm ince filmlerin yapısal analizi, X-ışını difraktometresi (XRD) ile gerçekleştirilmiştir.  Yapısal analiz sonuçlarına göre, tüm filmlerin çok kristalli bir yapıda ve monoklinik kristal formda olduklarını doğrulamaktadır. Farklı oranlarda katkılanan Ag konsantrasyonlarına bağlı olarak, kristalit büyüklüğü değerleri 14.83 ila 17.09 nm arasında değişmiştir. CuO ince filmlerin yüzey morfolojisi metalurjik mikroskop kullanılarak incelenmiştir. Yüzey çalışmaları CuO nanoyapılarının film yüzeylerinde homojen olarak dağıldığını göstermiştir. Tüm ince filmlerin optik analizleri UV-Vis-NIR spektrofotometresi kullanılarak incelenmiştir. Optiksel analiz sonuçları, CuO ince filmlerin optik bant aralığı enerjilerinin, gümüş konsantrasyonunun  0 M%'den  2.0 M%'ye yükselmesiyle, 1.34 eV’den 1.72 eV'ye yükseldiğini ortaya koymuştur. Gümüş konsantrasyonunun  3.0 M%'ye yükseltilmesiyle, bant aralığı enerjisi 1.68 eV'ye düşmüştür. Tüm filmlerin ortalama geçirgenliği, artan gümüş konsantrasyonu ile 2.0 %'dan  32.5 %'e yükselmiştir. 

0000-0002-7215-651X

Anahtar Kelimeler

• CuO ince film
• Katkılama
• Yüzey aktif madde
• Gümüş

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