Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

Yıl 2023, , 110 - 119, 31.03.2023

Ersin Temel , Abdullah Akkaya

https://doi.org/10.18185/erzifbed.1168992

Öz

In this study we introduce a simple program for cyclic current–voltage (I–V) measurements for bipolar and unipolar resistive switching devices. This program (Cyclic I-V, CYC-IV) was developed under the Keysight VEE Pro (Visual Engineering Environment Program) software and has a graphical interface. CYC-IV was developed for programming the Keysight B2912 Precision Source/Measure Unit (SMU) for I-V measurement of resistive switching devices in sweep mode. CYC-IV can be used in six different sweep mode. Moreover, the ramp rate, upper and lower limits of bias, cycle delay time and number of cycles easily define by user. Measurement results were visualized in three graphs that can be viewed simultaneously with the measurements.

Anahtar Kelimeler

cyclic I-V, sweep mode, VEE Pro, resistive switching devices, SMU

Kaynakça

• [1] A. Akkaya, E. Ayyıldız, Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC), Journal of Circuits, Systems and Computers, 29 (2020) 2050215.
• [2] A. Akkaya, E. Ayyıldız, Automation Software for Semiconductor Research Laboratories: Measurement System and Instrument Control Program (SeCLaS-IC), MAPAN, 35 (2020) 343-350.
• [3] A. Cabrini, L. Gobbi, D. Baderna, G. Torelli, A compact low-cost test equipment for thermal and electrical characterization of integrated circuits, Measurement, 42 (2009) 281-289.
• [4] P. Visconti, P. Costantini, C. Orlando, A. Lay-Ekuakille, G. Cavalera, Software solution implemented on hardware system to manage and drive multiple bi-axial solar trackers by PC in photovoltaic solar plants, Measurement, 76 (2015) 80-92.
• [5] S. Wu, Electrical Automation Control System Based on Brovey Algorithm, in: 2022 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC), 2022, pp. 1304-1308.
• [6] O. Kahveci, M.F. Kaya, Farklı Metal/n-Si Kontakların Sayısal Olarak Modellenmesi ve Simülasyonu, Karadeniz Fen Bilimleri Dergisi, 12 (2022) 398-413. [7] E. Garzón, F. Sanchez, L.M. Procel, L. Trojman, Remote control of VNA and parameter analyzer for RFCV measurements using Python, in: 2016 IEEE ANDESCON, 2016, pp. 1-4.
• [8] S.H. Bayes, S. Shukri, R.S. Balog, Low Cost, Stand-Alone, In-situ PV Curve Trace, in: 2020 2nd International Conference on Photovoltaic Science and Technologies (PVCon), 2020, pp. 1-6.
• [9] D. Ursutiu, C. Samoila, P. Cotfas, D.T. Cotfas, D.V. Pop, M.E. Auer, D.G. Zutin, Multifunction iLab implemented laboratory, in: 2011 IEEE Global Engineering Education Conference (EDUCON), 2011, pp. 185-190.
• [10] A. Haleem, M. Javaid, R.P. Singh, S. Rab, R. Suman, Hyperautomation for the enhancement of automation in industries, Sensors International, 2 (2021) 100124.
• [11] Y. Chen, ReRAM: History, Status, and Future, Ieee T Electron Dev, 67 (2020) 1420-1433.
• [12] M. Lanza, H.-S.P. Wong, E. Pop, et al., Recommended Methods to Study Resistive Switching Devices, Advanced Electronic Materials, 5 (2019) 1800143.
• [13] Keysight, VEE Pro v9.33 User Manual in. https://www.keysight.com/us/en/assets/9018-41106/user-manuals/9018-41106.pdf (accessed 08.08.2022)