The Effect of Solution Concentration and Thickness on the CuO Thin Film Grown with SILAR Technique

Öz

When thin film growth with SILAR technique is compared with other chemical techniques; more attractive, cheaper, simpler and less time consuming is preferred.The most important advantage of this technique is that some parameters such as time, thickness, number of immersion, solution concentration, temperature and pH of solution can be easily controlled during growth. In this study, the solution concentration was taken into consideration and CuO thin films were grown on the glass surface by using SILAR technique at different solution concentrations and different numbers of immersion. The structural and optical properties of the obtained CuO thin films were investigated according to the solution concentration and the number of immersion. X-Ray diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray (EDAX) were used for structural analysis and UV-vis spectrometer for optical analysis. The XRD data revealed that the films were crystallized in nano-size and that the quality of the crystallisation varied depending on the concentration of the solution.

Anahtar Kelimeler

• CuO,Thin Film,XRD,SEM,SILAR

Çözelti Konsantrasyonu ve Kalınlığın SILAR Tekniği ile Büyütülen CuO İnce Filmi Üzerine Etkisi

Öz

SILAR tekniği ile ince film büyütmek diğer kimyasal tekniklerle mukayese edildiğinde; daha çekici, daha ucuz, daha basit ve az zaman harcanmasından dolayı daha çok tercih edilmektedir. Bu tekniğin en önemli avantajı, büyüme boyunca zaman, kalınlık, daldırma sayısı, çözelti konsantrasyonu, sıcaklık ve çözelti pH’sı gibi bazı parametrelerin kolay kontrol edilebilir olmasıdır. Bu çalışmada çözelti konsantrasyonu ele alınarak CuO ince filmleri farklı çözelti konsantrasyonlarında ve farklı daldırma sayılarında SILAR tekniği kullanılarak cam yüzey üzerine büyütülmüştür. Elde edilen CuO ince filmlerin yapısal ve optiksel özelliklerinde çözelti konsantrasyonu ve daldırma sayısına göre meydana gelen değişiklikler incelenmiştir. Yapısal analizler için X-Işını difraksiyon (XRD), Atomik kuvvet mikroskobu (AFM), Taramalı Elektron mikroskobu (SEM) ve Enerji dağılımlı X-Işını spektrometresi (EDAX), optiksel analizler için UV-Vis spektrometresi kullanılmıştır. XRD verileri filmlerin nano boyutta kristalize olduklarını ve kristallenme kalitesinin çözelti konsantrasyonuna bağlı olarak değiştiğini açığa çıkarmıştır. 

Anahtar Kelimeler

• CuO,İnce film,XRD,SEM,SILAR.

Kaynakça

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