The Effect of Solution Concentration and Thickness on the CuO Thin Film Grown with SILAR Technique

Yıl 2020, Cilt: 13 Sayı: 1, 171 - 180, 20.03.2020

Tuba Çayır Taşdemirci

https://doi.org/10.18185/erzifbed.629161

Cited By: 1

Öz

When thin film growth with SILAR technique is compared
with other chemical techniques; more attractive, cheaper, simpler and less time
consuming is preferred.The most important advantage of this technique is that
some parameters such as time, thickness, number of immersion, solution
concentration, temperature and pH of solution can be easily controlled during
growth. In this study, the solution concentration was taken into consideration
and CuO thin films were grown on the glass surface by using SILAR technique at
different solution concentrations and different numbers of immersion. The
structural and optical properties of the obtained CuO thin films were
investigated according to the solution concentration and the number of
immersion. X-Ray diffraction (XRD), Atomic Force Microscopy (AFM), Scanning
Electron Microscopy (SEM) and Energy Dispersive X-Ray (EDAX) were used for
structural analysis and UV-vis spectrometer for optical analysis. The XRD data
revealed that the films were crystallized in nano-size and that the quality of
the crystallisation varied depending on the concentration of the solution.

Anahtar Kelimeler

CuO, Thin Film, XRD, SEM, SILAR

Çözelti Konsantrasyonu ve Kalınlığın SILAR Tekniği ile Büyütülen CuO İnce Filmi Üzerine Etkisi

Öz

SILAR
tekniği ile ince film büyütmek diğer kimyasal tekniklerle mukayese edildiğinde;
daha çekici, daha ucuz, daha basit ve az zaman harcanmasından dolayı daha çok
tercih edilmektedir. Bu tekniğin en önemli avantajı, büyüme boyunca zaman,
kalınlık, daldırma sayısı, çözelti konsantrasyonu, sıcaklık ve çözelti pH’sı
gibi bazı parametrelerin kolay kontrol edilebilir olmasıdır. Bu çalışmada
çözelti konsantrasyonu ele alınarak CuO ince filmleri farklı çözelti
konsantrasyonlarında ve farklı daldırma sayılarında SILAR tekniği kullanılarak
cam yüzey üzerine büyütülmüştür. Elde edilen CuO ince filmlerin yapısal ve
optiksel özelliklerinde çözelti konsantrasyonu ve daldırma sayısına göre
meydana gelen değişiklikler incelenmiştir. Yapısal analizler için X-Işını
difraksiyon (XRD), Atomik kuvvet mikroskobu (AFM), Taramalı Elektron mikroskobu
(SEM) ve Enerji dağılımlı X-Işını spektrometresi (EDAX), optiksel analizler
için UV-Vis spektrometresi kullanılmıştır. XRD verileri filmlerin nano boyutta
kristalize olduklarını ve kristallenme kalitesinin çözelti konsantrasyonuna
bağlı olarak değiştiğini açığa çıkarmıştır. 

Anahtar Kelimeler

CuO, İnce film, XRD, SEM, SILAR.

Kaynakça

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