| APA |
Tataroğlu, A., Güven, G., Yılmaz, S., & Büyükbaş, A. (2014). Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements. Gazi University Journal of Science, 27(3), 909-915. https://izlik.org/JA96RZ39KX
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| AMA |
1.Tataroğlu A, Güven G, Yılmaz S, Büyükbaş A. Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements. Gazi University Journal of Science. 2014;27(3):909-915. https://izlik.org/JA96RZ39KX
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| Chicago |
Tataroğlu, Adem, G. Güven, S. Yılmaz, and A. Büyükbaş. 2014. “Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-F and G ω-F Measurements”. Gazi University Journal of Science 27 (3): 909-15. https://izlik.org/JA96RZ39KX.
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| EndNote |
Tataroğlu A, Güven G, Yılmaz S, Büyükbaş A (August 1, 2014) Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements. Gazi University Journal of Science 27 3 909–915.
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| IEEE |
[1]A. Tataroğlu, G. Güven, S. Yılmaz, and A. Büyükbaş, “Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements”, Gazi University Journal of Science, vol. 27, no. 3, pp. 909–915, Aug. 2014, [Online]. Available: https://izlik.org/JA96RZ39KX
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| ISNAD |
Tataroğlu, Adem - Güven, G. - Yılmaz, S. - Büyükbaş, A. “Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-F and G ω-F Measurements”. Gazi University Journal of Science 27/3 (August 1, 2014): 909-915. https://izlik.org/JA96RZ39KX.
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| JAMA |
1.Tataroğlu A, Güven G, Yılmaz S, Büyükbaş A. Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements. Gazi University Journal of Science. 2014;27:909–915.
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| MLA |
Tataroğlu, Adem, et al. “Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-F and G ω-F Measurements”. Gazi University Journal of Science, vol. 27, no. 3, Aug. 2014, pp. 909-15, https://izlik.org/JA96RZ39KX.
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| Vancouver |
1.Adem Tataroğlu, G. Güven, S. Yılmaz, A. Büyükbaş. Analysis of Barrier Height and Carrier Concentration of MOS Capacitor Using C-f and G/ω-f Measurements. Gazi University Journal of Science [Internet]. 2014 Aug. 1;27(3):909-15. Available from: https://izlik.org/JA96RZ39KX
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