Araştırma Makalesi

Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation

Cilt: 11 Sayı: 1 17 Mart 2026
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EN

Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation

Öz

The behavior of metal/semiconductor structures with organic interfaces exposed to proton radiation in radiation environments was investigated. For this purpose, organic-based Schottky devices have been fabricated within laboratory facilities, and the fundamental electrical parameters of structures have been investigated using graphs. The current-voltage (I-V) characteristics of metal/methyl-red/semiconductor Schottky devices before and after irradiation have been obtained, and changes in their electrical parameters have been investigated using these characteristics. This study is important in the context of energy storage and protection in power applications of electronic devices for space grade. Recently, energy storage technologies and power systems resistant to changes in radiation environments has become critical in electronic power applications.

Anahtar Kelimeler

Destekleyen Kurum

Giresun University

Proje Numarası

FEN-BAP-A-150219-14

Teşekkür

We also thank Professor Dr. Serdar Karadeniz for his experimental insights and support that contributed to our work.

Kaynakça

  1. [1] Hepp AF, Kumta PN, Velikokhatnyi OI, Datta MK. Batteries for Aeronautics and Space Exploration: Recent Developments and Future Prospects Lithium-Sulfur Batteries. Advances in High-Energy Density Batteries 2022; 531-595.
  2. [2] Rhoderick EM, Williams RH. Metal–Semiconductor Contacts, 2nd Ed. Clarendon and Oxford, 1988.
  3. [3] Chand S, Bala S. Analysis of current–voltage characteristics of inhomogeneous Schottky diodes at low temperatures. Applied Surface Science 2005; 252: 358–363.
  4. [4] Simchi H, Heidarisaani M, Esmaeilzadeh M. Electron transport through nano-MOSFET in presence of electron-electron interaction. AIP Advances 2013; 3: 032124.
  5. [5] Xia P, Feng X, Ng RJ, Wang S, Chi D, Li C, He Z, Liu X, Ang K-W. Impact and Origin of Interface States in MOS Capacitor with Monolayer MoS2 and HfO2 High-k Dielectric. Scientific Reports. 2017; 7: 40669.
  6. [6] Ejderha S, Duman C, Nuhoglu C, Urhan F, Turut A. Effect of temperature on the current (capacitance and conductance)–voltage characteristics of Ti/n-GaAs diode Journal of Applied Physics 2014; 116: 234503.
  7. [7] Jyothi I, Janardhanam V, Hong H, Choi C. Analysis of current–voltage characteristics of inhomogeneous Schottky diodes at low temperatures. J., Mater. Sci. Semicond. 2015; Process. 39: 390–399.
  8. [8] Yildiz DE, Altindal S, Tekeli Z, Ozer M. The effects of surface states and series resistance on the performance of Au/SnO2/n-Si and Al/SnO2/p-Si (MIS) Schottky barrier diodes. Materials Science in Semiconductor Processing. 2010; 13: 34–40.

Ayrıntılar

Birincil Dil

İngilizce

Konular

Enerji

Bölüm

Araştırma Makalesi

Yayımlanma Tarihi

17 Mart 2026

Gönderilme Tarihi

10 Şubat 2026

Kabul Tarihi

13 Mart 2026

Yayımlandığı Sayı

Yıl 2026 Cilt: 11 Sayı: 1

Kaynak Göster

APA
Hacıosmanoğlu, T., & Karadeniz, H. (2026). Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation. International Journal of Energy Studies, 11(1), 801-817. https://doi.org/10.58559/ijes.1886286
AMA
1.Hacıosmanoğlu T, Karadeniz H. Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation. International Journal of Energy Studies. 2026;11(1):801-817. doi:10.58559/ijes.1886286
Chicago
Hacıosmanoğlu, Tuğba, ve Hande Karadeniz. 2026. “Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation”. International Journal of Energy Studies 11 (1): 801-17. https://doi.org/10.58559/ijes.1886286.
EndNote
Hacıosmanoğlu T, Karadeniz H (01 Mart 2026) Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation. International Journal of Energy Studies 11 1 801–817.
IEEE
[1]T. Hacıosmanoğlu ve H. Karadeniz, “Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation”, International Journal of Energy Studies, c. 11, sy 1, ss. 801–817, Mar. 2026, doi: 10.58559/ijes.1886286.
ISNAD
Hacıosmanoğlu, Tuğba - Karadeniz, Hande. “Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation”. International Journal of Energy Studies 11/1 (01 Mart 2026): 801-817. https://doi.org/10.58559/ijes.1886286.
JAMA
1.Hacıosmanoğlu T, Karadeniz H. Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation. International Journal of Energy Studies. 2026;11:801–817.
MLA
Hacıosmanoğlu, Tuğba, ve Hande Karadeniz. “Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation”. International Journal of Energy Studies, c. 11, sy 1, Mart 2026, ss. 801-17, doi:10.58559/ijes.1886286.
Vancouver
1.Tuğba Hacıosmanoğlu, Hande Karadeniz. Investigation of electrical properties of fabricated Schottky diodes with organic interfaces in terms of radiation. International Journal of Energy Studies. 01 Mart 2026;11(1):801-17. doi:10.58559/ijes.1886286