ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect

Cilt: 8 Sayı: 2 2 Ocak 2012
  • Y. Bourezıg
  • B. Bouabdallah
  • F. Gaıffot
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ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect

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ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect

Anahtar Kelimeler

Kaynakça

  1. Oana Y, Kotake H, Mukai N, and Ide K: Eectrical properties of polycrystalline silicon Mosfet’s on glass. J Appl Phys, 22, 493, (1983)
  2. T.I.Kamins: Hall mobility in chemically deposited polycrystalline silicon, J.Appl Phys.42, 4357, (1971)
  3. N.C.C.Lu, L.Gerzberg, J.D.Meindl, The effect of film thickness on the electrical properties of LPCVD polysilicon films. J Electrochem Soc. 131, 897, (1984)
  4. L.Mei, M.River, Y.K.Wark, R.W.Dutton, Grain growth mechanisms in polysilicon, J Electrochem Soc. 129, 1791, (1982)
  5. Y.Bourezig, H.Sehil, B.Zebentout, Z.Benamara, F.Raoult, O.Bonnaud, Solid State Phenomena 80-81 (2001)
  6. T.I.Kamins,Solid State Electronics ,789(1972)
  7. Warner J, Peisl M: exponential band tails in polycrystalline semiconductor films. Phys Rev. 31 6881, (1985)
  8. Sze SM: Physics of semiconductor Devices. Wiley edition New York 1981

Ayrıntılar

Birincil Dil

İngilizce

Konular

-

Bölüm

-

Yazarlar

Y. Bourezıg Bu kişi benim

B. Bouabdallah Bu kişi benim

F. Gaıffot Bu kişi benim

Yayımlanma Tarihi

2 Ocak 2012

Gönderilme Tarihi

2 Ocak 2012

Kabul Tarihi

-

Yayımlandığı Sayı

Yıl 2008 Cilt: 8 Sayı: 2

Kaynak Göster

APA
Bourezıg, Y., Bouabdallah, B., & Gaıffot, F. (2012). ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect. IU-Journal of Electrical & Electronics Engineering, 8(2), 733-738. https://izlik.org/JA56BW99CR
AMA
1.Bourezıg Y, Bouabdallah B, Gaıffot F. ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect. IU-Journal of Electrical & Electronics Engineering. 2012;8(2):733-738. https://izlik.org/JA56BW99CR
Chicago
Bourezıg, Y., B. Bouabdallah, ve F. Gaıffot. 2012. “ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect”. IU-Journal of Electrical & Electronics Engineering 8 (2): 733-38. https://izlik.org/JA56BW99CR.
EndNote
Bourezıg Y, Bouabdallah B, Gaıffot F (01 Ocak 2012) ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect. IU-Journal of Electrical & Electronics Engineering 8 2 733–738.
IEEE
[1]Y. Bourezıg, B. Bouabdallah, ve F. Gaıffot, “ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect”, IU-Journal of Electrical & Electronics Engineering, c. 8, sy 2, ss. 733–738, Oca. 2012, [çevrimiçi]. Erişim adresi: https://izlik.org/JA56BW99CR
ISNAD
Bourezıg, Y. - Bouabdallah, B. - Gaıffot, F. “ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect”. IU-Journal of Electrical & Electronics Engineering 8/2 (01 Ocak 2012): 733-738. https://izlik.org/JA56BW99CR.
JAMA
1.Bourezıg Y, Bouabdallah B, Gaıffot F. ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect. IU-Journal of Electrical & Electronics Engineering. 2012;8:733–738.
MLA
Bourezıg, Y., vd. “ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect”. IU-Journal of Electrical & Electronics Engineering, c. 8, sy 2, Ocak 2012, ss. 733-8, https://izlik.org/JA56BW99CR.
Vancouver
1.Y. Bourezıg, B. Bouabdallah, F. Gaıffot. ANALYSIS OF THE RESISTIVITY IN POLYSILICON THIN FILM TRANSISTORS Study of film thickness effect. IU-Journal of Electrical & Electronics Engineering [Internet]. 01 Ocak 2012;8(2):733-8. Erişim adresi: https://izlik.org/JA56BW99CR