Fabrication And Characterization Copper Doped Tungsten Oxide Thin Films (Cu:WO3) Using Electrodeposition Technique

Year 2020, , 234 - 241, 01.03.2020

Yunus Emre Fırat

https://doi.org/10.21597/jist.638601

Cited By: 1

Abstract

Nanostructured Cu:WO3 thin films were fabricated by electrodeposition technique on indium tin oxide (ITO)-coated glass substrate under room temperature. The choronoamperometric mode was applied to fabricate the films at -0.6 V for 1200 s. Deposition electrolyte was composed of sodium tungstate dihydrate (Na2WO4⸱2H2O), hydrogen peroxide (H2O2), sulphuric acid (H2SO4) and copper chloride (CuCl2). The pH of the solution was adjusted to 2 by H2SO4. Scanning electron microscopy (SEM) was used to examine the surface morphology and the films indicate porous structures. X-ray diffraction (XRD) device was used for crystal structure analysis and the characteristic peaks of Cu:WO3 phase were revealed. Using electrochemical impedance spectroscopy (EIS), the response of Cu:WO3 thin films to the alternating current frequency was measured and the interface resistance (RCT) of the film was obtained as 838.7 ohm.

Keywords

Electrodeposition, WO3, Chronoamperometry, Electrochemical impedance spectroscopy (EIS)

Elektrodepozisyon Yöntemiyle Bakır Katkılı Tungsten Oksit (Cu:WO3) İnce Filmlerinin Üretilmesi Ve Karakterizasyonu

Abstract

Nanoyapılı Cu:WO3 ince filmleri, elektrodepozisyon tekniğiyle indiyum kalay oksit (ITO) kaplı cam alttaş üzerine oda sıcaklığında büyütülmüştür. Filmlerin üretimi için kronoamperometri modu, -0.6 V potansiyelinde 1200 saniye uygulanmıştır. Kaplama elektroliti; sodyum tungstat dihidrat (Na2WO4⸱2H2O), hidrojen peroksit (H2O2), sülfürik asit (H2SO4) ve bakır klorür (CuCl2)’den oluşmaktadır. H2SO4 ile çözeltinin pH değeri 2 olarak ayarlanmıştır. Yüzey morfolojisinin incelenmesi için taramalı elektron mikroskobu (SEM) kullanılmıştır ve film yüzeylerinin boşluksu yapıya sahip olduğu görülmüştür. Kristal yapı analizi yapılması amacıyla X-ışınları kırınımı (XRD) cihazı kullanıldı ve Cu:WO3 fazına ait karakteristik pikler ortaya çıkmıştır. Elektrokimyasal Empedans Spektroskopisi (EIS) analiziyle, Cu:WO3 ince filmlerinin alternatif akım frekansına verdiği tepki ölçülmüştür ve filmin arayüzey direnci (RCT) 838.7 ohm olarak elde edilmiştir.

Keywords

Elektrodepozisyon, WO3, Kronoamperometri

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