In this study, the SnS2 thin film deposited
by spray
pyrolysis technique has been analyzed by XRD, SEM and UV-visible
characterization techniques to investigate of structural, morphological and
optical properties. The thin film has dominant (001)
and (002) crystallographic planes, compact grain-like morphology with uniform and
good coverage surface and 2.42 eV band gap. The Sn/SnS2/Si/Au-Ge
structure has been characterized by electrical measurement. The diode has
ideality factor of 1.34 and barrier height of 0.762 eV with reverse-bias
current temperature-dependent strongly. In addition, the ITO/SnS2/Si/Au-Ge
structure has been characterized by 1.5 AM solar simulator for determine of
solar light. The diode under 100 mW/cm2 solar-light source has
exhibited 0.24% PCE with Jsc
of 1.83 mA/cm2, Voc of 0.46 V and FF of 0.28.
I acknowledge the assistance of Dr. B. Güzeldir (Atatürk University) in preparation of the thin film.
In this study, the SnS2 thin film deposited by spray pyrolysis technique has been analyzed by XRD, SEM and UV-visible characterization techniques to investigate of structural, morphological and optical properties. The thin film has dominant (001) and (002) crystallographic planes, compact grain-like morphology with uniform and good coverage surface and 2.42 eV band gap. The Sn/SnS2/Si/Au-Ge structure has been characterized by electrical measurement. The diode has ideality factor of 1.34 and barrier height of 0.762 eV with reverse-bias current temperature-dependent strongly. In addition, the ITO/SnS2/Si/Au-Ge structure has been characterized by 1.5 AM solar simulator for determine of solar light. The diode under 100 mW/cm2 solar-light source has exhibited 0.24% PCE with Jsc of 1.83 mA/cm2, Voc of 0.46 V and FF of 0.28.
Primary Language | English |
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Subjects | Metrology, Applied and Industrial Physics |
Journal Section | Fizik / Physics |
Authors | |
Publication Date | March 1, 2020 |
Submission Date | November 4, 2019 |
Acceptance Date | December 2, 2019 |
Published in Issue | Year 2020 |