Araştırma Makalesi

Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode

Cilt: 11 Sayı: 4 15 Aralık 2021
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Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode

Öz

The subject of this study is the use of Indigo Carmine (IC) material in Schottky diode application. The p-Si crystal was chosen as the base material for diode fabrication. One surface of the p-Si metal was coated with Al metal by thermal evaporation method. Indigo carmine interface material was coated on the other surface of p-Si by spin coating method. Finally, Cr metal was coated on this material with DC sputtering method. So we obtained refence Cr/p-Si/Al diode and Cr/IC/p-Si/Al heterojunctions diode. When the current-voltage (I-V) measurements of these diodes at room temperature were examined, it was determined that the Indigo Carmine material improved the diode parameters. It was determined from the I-V measurements of the Cr/IC/p-Si/Al diode for different temperatures that the ideality factor (n) decreased and the barrier height (Φb) value increased with the increasing temperature. These changes with temperature have been attributed to the inhomogeneous distribution in the potential barrier. In addition, the change of diode parameters with temperature showed that the diode has a double Gaussian distribution.

Anahtar Kelimeler

Kaynakça

  1. Afandiyeva IM, Demirezen S, Altındal Ş, 2013. Temperature dependence of forward and reverse bias current-voltage characteristics in Al-TiW-PtSi/n-Si Schottky barrier diodes with the amorphous diffusion barrier. Journal of Alloys and Compounds, 552:423-429.
  2. Altan H, Özer M, Ezgin H, 2020. Investigation of electrical parameters of Au/P3HT:PCBM/ n-6H–SiC/Ag Schottky barrier diode with different current conduction models. Superlattices and Microstructures, 146:106658.
  3. Balasubramani V, Chandrasekaran J, Nyugen TD, Maruthamuthu S, Marnadu R, Vivek P, Sugarthi S, 2020. Colossal photosensitive boost in Schottky diode behaviour with Ce-V2O5 interfaced layer of MIS structure. Sensors and Actuators A: Physical, 315:112333.
  4. Beştaş AN, Yazıcı S, Aktaş F, Abay B, 2014. Double Gaussian distribution of barrier height for FeCrNiC alloy Schottky contacts on p-Si substrates. Applied Surface Science, 318:280-284.
  5. Bobby A, Verma S, Asokan K, Sarun PM, Antony BK, 2013. Phase transition induced double-Gaussian barrier height distribution in Schottky diode. Physica B, 431:6-10.
  6. Chand S, Kumar J, 1996. Evidence for the double distribution of barrier heights in Pd2Si/n-Si Schottky diodes from I-V-T measurements. Semiconductor Science and Technology, 11(1):1203-1208.
  7. Çaldıran Z, 2019. Fabrication of Schottky barrier diodes with the lithium flüoride interface layer and electrical characterization in a wide temperature range. Journal of Alloys and Compounds, 816:152601.
  8. Deniz AR, Çaldıran Z, Metin Ö, Can H, Meral K, Aydoğan Ş, 2014. Schottky diode performance of an Au/Pd/GaAs device fabricated by deposition of monodisperse palladium nanoparticles over a p-type GaAs substrate. Materials Science in Semiconductor Processing, 27:163-169.

Ayrıntılar

Birincil Dil

İngilizce

Konular

Metroloji,Uygulamalı ve Endüstriyel Fizik

Bölüm

Araştırma Makalesi

Yayımlanma Tarihi

15 Aralık 2021

Gönderilme Tarihi

24 Mayıs 2021

Kabul Tarihi

20 Eylül 2021

Yayımlandığı Sayı

Yıl 2021 Cilt: 11 Sayı: 4

Kaynak Göster

APA
Deniz, A. R. (2021). Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode. Journal of the Institute of Science and Technology, 11(4), 2790-2802. https://doi.org/10.21597/jist.942302
AMA
1.Deniz AR. Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode. Iğdır Üniv. Fen Bil Enst. Der. 2021;11(4):2790-2802. doi:10.21597/jist.942302
Chicago
Deniz, Ali Rıza. 2021. “Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode”. Journal of the Institute of Science and Technology 11 (4): 2790-2802. https://doi.org/10.21597/jist.942302.
EndNote
Deniz AR (01 Aralık 2021) Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode. Journal of the Institute of Science and Technology 11 4 2790–2802.
IEEE
[1]A. R. Deniz, “Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode”, Iğdır Üniv. Fen Bil Enst. Der., c. 11, sy 4, ss. 2790–2802, Ara. 2021, doi: 10.21597/jist.942302.
ISNAD
Deniz, Ali Rıza. “Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode”. Journal of the Institute of Science and Technology 11/4 (01 Aralık 2021): 2790-2802. https://doi.org/10.21597/jist.942302.
JAMA
1.Deniz AR. Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode. Iğdır Üniv. Fen Bil Enst. Der. 2021;11:2790–2802.
MLA
Deniz, Ali Rıza. “Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode”. Journal of the Institute of Science and Technology, c. 11, sy 4, Aralık 2021, ss. 2790-02, doi:10.21597/jist.942302.
Vancouver
1.Ali Rıza Deniz. Investigation of I-V-T Charactersitics of Cr/Indigo Carmine/p-Si/Al Heterojunction Diode. Iğdır Üniv. Fen Bil Enst. Der. 01 Aralık 2021;11(4):2790-802. doi:10.21597/jist.942302

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