SILAR Tekniği Kullanılarak Sentezlenen Polikristal Copper Oxide İnce Filmlerin Yapısal ve Optiksel Özellikleri

Yıl 2024, Cilt: 14 Sayı: 4, 2216 - 2226, 15.12.2024

Ali Çelik , Fatma Göde

https://doi.org/10.31466/kfbd.1543126

Öz

Bu çalışmada farklı pH değerlerinde polikristal bakır oksit (CuO) yarı iletken ince filmleri ardışık iyon tabakası adsorpsiyonu ve reaksiyon (SILAR) tekniği kullanılarak elde edilmiştir. Üretilen ince filmlerin yapısal ve optik karakteristikleri üzerinde pH’ın etkisi incelenmiştir. Filmler, X-ışınları kırınımı (XRD) ve Uv-vis spektroskopisi ölçümleri ile karakterize edilmişlerdir. XRD bulguları, elde edilen tüm filmlerin kristal yapıda monoklinik CuO fazına sahip olduğunu göstermiştir. Tauc bağıntısı kullanılarak, filmlerin direkt optik bant aralığı enerjilerinin 1.49 eV ile 2.89 eV arasında değiştiği belirlenmiştir. Optik parametreler; kırılma indisi (n), sönüm katsayısı (k), dielektrik sabitinin real (ε_1), ve sanal (ε_2) kısımları soğurma ve geçirgenlik ölçümleri kullanılarak hesaplanmıştır. CuO ince filmin n değerleri 3.10 ile 11.14 arasında değişirken k değerleri 0.79 ile 1.70 arasında değişmiştir. Benzer şekilde CuO ince filmleri için ε_1, ve ε_2 değerleri sırasıyla 8.96 ile 121.15 ve 4.89 ile 37.90 arasında değişmiştir.

Anahtar Kelimeler

Bakır oksit, İnce filmler, XRD, Bant aralığı enerjisi, Optik parametreler

The Structural and Optical Properties of Polycrystalline Copper Oxide Thin Films Synthesized Using the SILAR Technique

Öz

In this study, polycrystalline copper oxide (CuO) thin films with the presence of various pH levels were fabricated using the successive ion layer adsorption and reaction (SILAR) method. The impact of pH on the structural and optical properties of the produced films was examined. The present films were characterized by X-ray diffraction (XRD) and UV-vis absorption spectroscopy measurements. The XRD result showed that all films had a polycrystalline nature with a monoclinic CuO crystal phase. Direct optical band gap energies of the films, determined using the Tauc equation, ranged from 1.49 eV to 2.89 eV. The optical parameters such as refractive index (n), extinction coefficient (k), real (ε_1), and imaginary (ε_2) parts of the dielectric constant were derived from the absorbance and transmittance spectra of the produced films. CuO thin film n values ranged from 3.10 to 11.14, while k values varied from 0.79 to 1.70. Likewise, the values of ε_1 and ε_2 for CuO thin films ranged from 8.96 to 121.15 and 4.89 to 37.90, respectively.

Anahtar Kelimeler

Copper Oxide, Thin films, XRD, Band gap energy, Optical parameters

Kaynakça

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