Cu₂ZnSn(S,Se)₄ (CZTSSe) İnce Filminin Sputter Yöntemi ile Büyütülmesi ve Karakterizasyonunun Araştırılması

Öz

Bu çalışmada Cu₂ZnSn(S,Se)₄ (CZTSSe) ince filmler, sputter yöntemi ile İTO kaplı cam altlık üzerine büyütülmüş ve sonrasında uygun tavlama işlemi uygulanarak filmlerin kristal yapıları geliştirilmiştir. Sputter yöntemi film kalınlığının kontrol edilebilir olması ve yüksek saflıkta ve homojen yapılı ince filmler elde edilmesine olanak sağlaması nedeniyle tercih edilmiştir. Hazırlanan ince filmlerin yapısal özellikleri X-ışını kırınımı (XRD) ve Raman spektroskopisi, morfolojik özellikleri taramalı elektron mikroskobu (SEM) ve atomik kuvvet mikroskobu (AFM) ile elementel bileşimi ise enerji dağılımlı X-ışını spektroskopisi (EDX) yöntemiyle analiz edilmiştir. Elde edilen bulgular, sputter yöntemiyle büyütülen CZTSSe ince filmlerin yüksek derecede kristalleşmiş kesterit yapıda oluştuğunu göstermiştir. Yüzey morfolojisinin homojen, yoğun taneli bir doku sergilediğini ortaya koymuştur. Bu sonuçlar, CZTSSe tabanlı ince filmlerin çevre dostu, düşük maliyetli ve sürdürülebilir fotovoltaik uygulamalarda umut vadedici soğurucu katman olarak değerlendirilebileceğini desteklemektedir.

Anahtar Kelimeler

• CZTSSe
• XRD
• AFM
• SEM
• Raman Spektroskopisi

Investigation of the Growth and Characterization of Cu₂ZnSn(S,Se)₄ (CZTSSe) Thin Film Prepared by the Sputtering Method

Öz

In this study, Cu₂ZnSn(S,Se)₄ (CZTSSe) thin films were grown on indium tin oxide (ITO) coated glass substrates by the sputtering method, and their crystal structures were improved through an appropriate annealing process. The sputtering technique was chosen because it allows precise control of film thickness and enables the deposition of high-purity and homogeneous thin films. The structural properties of the prepared films were analyzed by X-ray diffraction (XRD) and Raman spectroscopy; the morphological properties were examined using scanning electron microscopy (SEM) and atomic force microscopy (AFM); and the elemental composition was determined by energy-dispersive X-ray spectroscopy (EDX). The obtained findings revealed that the CZTSSe thin films grown by the sputtering method exhibited a highly crystallized kesterite structure. The surface morphology showed a homogeneous and densely packed grain texture. These results support that CZTSSe-based thin films can be evaluated as promising absorber layers for environmentally friendly, low-cost, and sustainable photovoltaic applications.

Anahtar Kelimeler

• CZTSSe
• thin films
• XRD
• AFM
• Raman spectroscopy

Kaynakça

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