EVALUATION OF THE RadFET RADIATION SENSOR PERFORMANCE IN 18 MV-EXTERNAL BEAM
Öz
The radiation response of RadFET irradiated with 18 MV X-rays emitted from a linear
accelerator was examined on threshold voltage shifts and trap densities. The measured threshold voltages
were compared before and after irradiation. Trap densities calculated using various techniques in the gate
oxide and oxide/silicon interface were interpreted. The ΔVth – D graph showed excellent linearity of up to
just about 2 Gy. The RadFETs response to radiation started to deviate from linearity after 2 Gy due to
increasing oxide trapped charges induced by electric field screening. The experimental outcomes are in
good accordance with the fitting function given for RadFETs. Fixed and switching traps formed by
irradiation were investigated. The density of the fixed traps was significantly higher than the density of
the switching traps. From the threshold voltages measured under zero gate voltage in a certain time
interval, the percentage fading range was calculated as 0.004-1.235%.
Anahtar Kelimeler
Kaynakça
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Ayrıntılar
Birincil Dil
İngilizce
Konular
Mühendislik
Bölüm
Araştırma Makalesi
Yazarlar
Berk Morkoç
Bu kişi benim
Türkiye
Dinçer Yeğen
0000-0003-3180-600X
Türkiye
Ercan Yılmaz
0000-0002-6652-4662
Türkiye
Yayımlanma Tarihi
31 Aralık 2019
Gönderilme Tarihi
26 Nisan 2019
Kabul Tarihi
18 Kasım 2019
Yayımlandığı Sayı
Yıl 2019 Cilt: 24 Sayı: 3