TR
EN
Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses
Abstract
In this study, The inheritance of various yield traits in the population of 4x4 full diallel crosses of the three varieties and one line in durum wheat were investigated. In this research; days to heading, peduncle length, plant height, spikelet number per spike, kernel number per spike, and grain yield per plant were observed in all parents and their hybrid progenies. Additive gene actions were found to be significant for plant height, kernel number per spike, and peduncle length, while both additive and non-additive gene action was determined to be significant for spikelet number per spike and non-additive gene actions were found to be significant for grain yield per plant and days to heading. GCA effects were obtained to be significant for plant height, and grain yield per plant in Kızıltan- 91 cultivar; for plant height, kernel number per spike, spikelet number per spike, peduncle length, and grain yield per plant in Ç-1252 cultivar; for plant height, and days to heading in Çakmak-79 cultivar, also for plant height, kernel number per spike, peduncle length, grain yield per plant, and days to heading in the BDMM line. The hybrid combinations which had significant heterosis and heterobetiosis effects were found for all traits observed. Narrow-sense heritability ranged from 0.28 and 0.85 for all traits while kernel number per spike had the highest narrow-sense heritability value (0.89).
Keywords
Supporting Institution
SELÇUK ÜNİVERSİTESİ
References
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Details
Primary Language
English
Subjects
Field Crops and Pasture Production (Other)
Journal Section
Research Article
Publication Date
September 15, 2001
Submission Date
January 1, 2001
Acceptance Date
February 2, 2001
Published in Issue
Year 2001 Volume: 15 Number: 27
APA
Kaya, Y., & Topal, A. (2001). Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk Journal of Agriculture and Food Sciences, 15(27), 102-116. https://izlik.org/JA77JF98XX
AMA
1.Kaya Y, Topal A. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci. 2001;15(27):102-116. https://izlik.org/JA77JF98XX
Chicago
Kaya, Yüksel, and Ali Topal. 2001. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. Durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences 15 (27): 102-16. https://izlik.org/JA77JF98XX.
EndNote
Kaya Y, Topal A (September 1, 2001) Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk Journal of Agriculture and Food Sciences 15 27 102–116.
IEEE
[1]Y. Kaya and A. Topal, “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses”, Selcuk J Agr Food Sci, vol. 15, no. 27, pp. 102–116, Sept. 2001, [Online]. Available: https://izlik.org/JA77JF98XX
ISNAD
Kaya, Yüksel - Topal, Ali. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. Durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences 15/27 (September 1, 2001): 102-116. https://izlik.org/JA77JF98XX.
JAMA
1.Kaya Y, Topal A. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci. 2001;15:102–116.
MLA
Kaya, Yüksel, and Ali Topal. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. Durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences, vol. 15, no. 27, Sept. 2001, pp. 102-16, https://izlik.org/JA77JF98XX.
Vancouver
1.Yüksel Kaya, Ali Topal. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci [Internet]. 2001 Sep. 1;15(27):102-16. Available from: https://izlik.org/JA77JF98XX