Araştırma Makalesi

Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses

Cilt: 15 Sayı: 27 15 Eylül 2001
  • Yüksel Kaya
  • Ali Topal
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Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses

Öz

In this study, The inheritance of various yield traits in the population of 4x4 full diallel crosses of the three varieties and one line in durum wheat were investigated. In this research; days to heading, peduncle length, plant height, spikelet number per spike, kernel number per spike, and grain yield per plant were observed in all parents and their hybrid progenies. Additive gene actions were found to be significant for plant height, kernel number per spike, and peduncle length, while both additive and non-additive gene action was determined to be significant for spikelet number per spike and non-additive gene actions were found to be significant for grain yield per plant and days to heading. GCA effects were obtained to be significant for plant height, and grain yield per plant in Kızıltan- 91 cultivar; for plant height, kernel number per spike, spikelet number per spike, peduncle length, and grain yield per plant in Ç-1252 cultivar; for plant height, and days to heading in Çakmak-79 cultivar, also for plant height, kernel number per spike, peduncle length, grain yield per plant, and days to heading in the BDMM line. The hybrid combinations which had significant heterosis and heterobetiosis effects were found for all traits observed. Narrow-sense heritability ranged from 0.28 and 0.85 for all traits while kernel number per spike had the highest narrow-sense heritability value (0.89).

Anahtar Kelimeler

Destekleyen Kurum

SELÇUK ÜNİVERSİTESİ

Kaynakça

  1. Alcala, D.S.M., 1973. Evaluation of parental performance for grain yield in two popu- lations of wheat (Triticum aestivum will. Host.) Ph.D. Thesis, Oregon State University, Corvallis.
  2. Altınbaş, M., ve Bilgen, O., 1996. İki ekmeklik buğday (T. aestiviun L.) melezinde başak özelliklerinin genetiği üzerinde bir araştırma. Anadolu J. of AARI 84-99.
  3. Anonymous., 1999. Milli Çeşit Listesi. Tohumluk Tescil ve Sertifikasyon Merkezi Müdürlüğü, Ankara.
  4. Aydem, N., 1979. Beş makarnalık buğday çeşidinin diallel melez döllerinde bazı agronomik özelliklerin kalıtımı üzerinde araştırmalar. Doçentlik Tezi E.Ü. Z.F., İzmir,
  5. Bağcı, S.A. ve Ekiz, H., 1993. Makarnalık buğdayların verim potansiyeli ve problemleri. Makarnalık Buğday ve Mamulleri Sempozyumu. Ankara.
  6. Barriga, P., 1979. Inheritance of photosynthetic areas above the flag leaf node in spring wheat. Inst. De produccion Vegetal, Universidad Austral de Chile, Valdivia.
  7. Bitzer, M.J., Patterson, F.L. and Nyguist, W.E., 1982. Hybrid vigor and combining ability in a high-low yielding eight parent diallel cross of soft red winter wheat. Crop Sci. 22:1126-1128.
  8. Chiang, M.S. and Smith, J.D., 1967. Diallel analysis of inheritance of quantitative characters in grain sorghum. 1. heterosis and breeding depression. Can. J. Genet, Cyttol, 9; 44-51.

Ayrıntılar

Birincil Dil

İngilizce

Konular

Tarla Bitkileri Yetiştirme ve Islahı (Diğer)

Bölüm

Araştırma Makalesi

Yazarlar

Yüksel Kaya Bu kişi benim
Türkiye

Ali Topal Bu kişi benim
Türkiye

Yayımlanma Tarihi

15 Eylül 2001

Gönderilme Tarihi

1 Ocak 2001

Kabul Tarihi

2 Şubat 2001

Yayımlandığı Sayı

Yıl 2001 Cilt: 15 Sayı: 27

Kaynak Göster

APA
Kaya, Y., & Topal, A. (2001). Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk Journal of Agriculture and Food Sciences, 15(27), 102-116. https://izlik.org/JA77JF98XX
AMA
1.Kaya Y, Topal A. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci. 2001;15(27):102-116. https://izlik.org/JA77JF98XX
Chicago
Kaya, Yüksel, ve Ali Topal. 2001. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences 15 (27): 102-16. https://izlik.org/JA77JF98XX.
EndNote
Kaya Y, Topal A (01 Eylül 2001) Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk Journal of Agriculture and Food Sciences 15 27 102–116.
IEEE
[1]Y. Kaya ve A. Topal, “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses”, Selcuk J Agr Food Sci, c. 15, sy 27, ss. 102–116, Eyl. 2001, [çevrimiçi]. Erişim adresi: https://izlik.org/JA77JF98XX
ISNAD
Kaya, Yüksel - Topal, Ali. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences 15/27 (01 Eylül 2001): 102-116. https://izlik.org/JA77JF98XX.
JAMA
1.Kaya Y, Topal A. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci. 2001;15:102–116.
MLA
Kaya, Yüksel, ve Ali Topal. “Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses”. Selcuk Journal of Agriculture and Food Sciences, c. 15, sy 27, Eylül 2001, ss. 102-16, https://izlik.org/JA77JF98XX.
Vancouver
1.Yüksel Kaya, Ali Topal. Diallel Analysis of Single Plant Yield and Some Yield Traits in Durum Wheat (T. durum Desf.) Crosses. Selcuk J Agr Food Sci [Internet]. 01 Eylül 2001;15(27):102-16. Erişim adresi: https://izlik.org/JA77JF98XX

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