Measurement of K Level Natural Line Widths, Kα1 and Kα2 X-Ray Line Widths

Yıl 2021, , 837 - 848, 31.08.2021

Ömer Söğüt

https://doi.org/10.18185/erzifbed.927078

Öz

In this study, the K shell natural line widths with K1 and K2 X-ray line widths of Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn elements and compounds were semi-experimentally calculated by using the values of K shell fluorescence yield. An 241Am radioisotope source, emitting in 75 mCi intensity and 59.5 keV energy gamma rays was used to stimulate the samples. A solid state Si(Li) detector have a resolution 155 eV at 5.96 keV, was used to count K X-rays emitted from the specimens. It was determined that the X-ray line widths of ΓK1 and ΓK2 and the natural line width of the ΓK K level vary depending on the chemical structure. The results show that ΓK, ΓK1 and ΓK2 line widths measured in compounds deviated up to 5-48% from according to values of the pure element. The present results, for pure elements, are in good agreement with the results of other researchers in the literature within the limits of error.

Anahtar Kelimeler

K X-rays, chemical effect, fluorescence yield, line width

Destekleyen Kurum

Kahramanmaraş Sütçü İmam Üniversitesi Araştırma Projeleri Koordinasyon Birimi

Proje Numarası

2017/2-35 M

Teşekkür

Bu araştırma, Kahramanmaraş Sütçü İmam Üniversitesi Bilimsel Araştırma Projeleri Birimi (BAP) tarafından desteklenmiştir ve yazarlar bu destek için BAP birimine minnettardır.

Measurement of K Level Natural Line Widths, Kα1 and Kα2 X-Ray Line Widths

Öz

Bu çalışmada Ti, V, Cr, Mn, Fe, Co, Ni, Cu ve Zn element ve bileşiklerinin K kabuğu doğal çizgi genişlikleri ile Kα1 ve Kα2 X-ışını çizgi genişlikleri yarı deneysel olarak, K kabuk flüoresans verimi değerleri kullanılarak hesaplandı. Numuneleri uyarmak için 75mCi şiddetinde ve 59. 5 keV enerjili gama ışınları yayınlayan 241Am radyoizotop kaynağı kullanıldı. Numunelerden yayınlanan K X-ışınlarını saymak için çözünürlüğü 5.96 keV'de 155 eV olan katı hal Si(Li) detektörü kullanıldı. Kimyasal yapıya bağlı olarak K seviyesi doğal çizgi genişliği ile Kα1 ve Kα2 X-ışını çizgi genişliklerinin değiştiği tespit edildi. Sonuçlar bileşiklerde ölçülen ΓK, ΓKα1 and ΓKα2 çizgi genişliklerinin saf element değerlerine göre % 5-48 kadar değiştiğini göstermektedir. Ancak, saf elementler için ölçülen deneysel sonuçlar, literatürdeki diğer araştırmacıların sonuçlarıyla hata sınırları dâhilinde iyi bir uyum içinde olduğu bulunmuştur.

Anahtar Kelimeler

K X-rays, chemical effect, fluorescence yield, line width, Kα1 and Kα2.

Proje Numarası

2017/2-35 M

Kaynakça

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