CuMnO2 Filmlerini Yapısal ve Optik Özellikleri Üzerinde Tabaka Kalınlığının Etkisi

Yıl 2022, Cilt: 8 Sayı: 2, 386 - 396, 31.12.2022

Şilan Baturay Canan Aytuğ Ava

https://doi.org/10.29132/ijpas.1099982

Öz

Çalışmada, farklı tabaka kalınlıklarda mezogözenekli CuMnO2 ince filmler dönel kaplama tekniği kullanılarak cam alttaş üzerine biriktirilmiştir. Elde edilen örneklerin fiziksel özellikleri X-ışını kırınımı (XRD), taramalı elektron mikroskopu (SEM), atomik kuvvet mikroskopu (AFM) ve UV-Vis ölçüm sistemi kullanılarak incelenmiştir. XRD analizi kullanılarak örneklerin mikro yapı, stres değeri, kristal büyüklüğü ve dislokasyon yoğunluğu hesaplandı. SEM görüntüleri elde edilen örneklerin küresele benzer nanoyapıların oluştuğunu ve nanoparçacıkların sayısının kalınlığa bağlı olarak arttığı göstermektedir. SEM görüntülerinden elde edilen yüzey özellikleri AFM görüntüleri ile doğrulanmaktadır. FEI Quanta 250 FEG taramalı electron mikroskopu (SEM) ile örneklerin tabaka kalınlığı yaklaşık olarak CuMnO2(I) için 157, CuMnO2(II) için 684 ve CuMnO2 (III) için 935 nm civarında ölçülmüştür. Örneklerin enerji bant aralığı ve soğurma değerleri 300-1100 nm aralığında UV-vis cihazı kullanılarak analiz edildi. Örneklerin soğurma değeri filmin kalınlığının artışına bağlı olarak değişmiştir. Enerji bant aralığı değeri ise, kalınlığın değişimine bağlı olarak radikal bir şekilde 1.78'den 1.92 eV'ye artmıştır.

Anahtar Kelimeler

İnce Film, Soğurma, Uv-vis, XRD

Teşekkür

Dicle Üniversitesi Bilim ve Teknoloji Uygulama ve Araştırma Merkezi'ne yardımlarından ötürü teşekkür ederiz.

The Effect of Layer Thickness on Structural and Optical Properties of CuMnO2 Films

Öz

In this study, mesoporous CuMnO2 thin films with different layer thicknesses were deposited on glass substrate using spin coating technique. The physical properties of the obtained samples were investigated using X-ray diffraction (XRD), scanning electron microscope (SEM), atomic force microscope (AFM) and UV-Vis. Microstructure, interplanetary distance, crystal size and dislocation density of the samples were calculated using XRD analysis. SEM images show that spherical nanostructures of the samples are formed and the number of nanoparticles increases depending on the thickness. Surface features obtained from SEM images are confirmed by AFM images. The layer thickness of the samples was measured as 157 nm for CuMnO2(I), 684 nm for CuMnO2(II) and 935 nm for CuMnO2(III) with an FEI Quanta 250 FEG scanning electron microscope (SEM). The energy band gap and absorption values of the samples were analyzed using a UV-vis device in the range of 300-1100 nm. The absorption value of the samples changed depending on the change in the thickness of the film. The energy band gap value increased radically from 1.78 to 1.92 eV depending on the increase in thickness.

Anahtar Kelimeler

Thin Film, Absorpsion, Uv-vis, XRD

Kaynakça

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